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Volumn , Issue , 2012, Pages 1308-1313

Moisture diffusion and integrated stress analysis in LED module

Author keywords

FEM; LED; moisture; reflow; reliability

Indexed keywords

FINITE ELEMENT MODELS; INITIAL MOISTURE; INTEGRATED STRESS; MOISTURE DIFFUSION; MOISTURE DISTRIBUTION; OPERATION CONDITIONS; REFLOW; REFLOW--SOLDERING;

EID: 84875426950     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT-HDP.2012.6474846     Document Type: Conference Paper
Times cited : (4)

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    • Tong Yan Tee, Zhaowei Zhong. "Integrated vapor pressure, hygroswelling, and thermo-mechanical stress modeling of QFN package during retlow with interfacial fracture mechanics analysis". Microelectronics Reliability, 44(2004),pp.1 05-114.
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  • 12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.