-
1
-
-
0001035841
-
Yield strength predictions from the plastic zone around nanocontacts
-
D. Kramer, H. Huang, M. Kriese, J. Robach, J. Nelson, A. Wright, D. Bahr, and W. Gerberich: Yield strength predictions from the plastic zone around nanocontacts. Acta Mater. 47, 333-343 (1998).
-
(1998)
Acta Mater.
, vol.47
, pp. 333-343
-
-
Kramer, D.1
Huang, H.2
Kriese, M.3
Robach, J.4
Nelson, J.5
Wright, A.6
Bahr, D.7
Gerberich, W.8
-
2
-
-
0032646836
-
Transmission electron microscopy observations of low-load indents in GaAs
-
E. Lebourhis and G. Patriarche: Transmission electron microscopy observations of low-load indents in GaAs. Philos. Mag. Lett. 79, 805-812 (1999).
-
(1999)
Philos. Mag. Lett.
, vol.79
, pp. 805-812
-
-
Lebourhis, E.1
Patriarche, G.2
-
4
-
-
33644536187
-
Observations of nanoindents via cross-sectional transmission electron microscopy: A survey of deformation mechanisms
-
S.J. Lloyd, A. Castellero, F. Giuliani, Y. Long, K.K. McLaughlin, J.M. Molina-Aldareguia, N.A. Stelmashenko, L.J. Vandeperre, and W.J. Clegg: Observations of nanoindents via cross-sectional transmission electron microscopy: A survey of deformation mechanisms. Proc. R. Soc, Ser. A 461, 2521-2543 (2005).
-
(2005)
Proc. R. Soc, Ser. A
, vol.461
, pp. 2521-2543
-
-
Lloyd, S.J.1
Castellero, A.2
Giuliani, F.3
Long, Y.4
McLaughlin, K.K.5
Molina-Aldareguia, J.M.6
Stelmashenko, N.A.7
Vandeperre, L.J.8
Clegg, W.J.9
-
5
-
-
84866091745
-
Deformation mechanisms in nanotwinned metal nanopillars
-
D. Jang, X. Li, H. Gao, and J.R. Greer: Deformation mechanisms in nanotwinned metal nanopillars. Nat. Nanotechnol. 7, 594-601 (2012).
-
(2012)
Nat. Nanotechnol.
, vol.7
, pp. 594-601
-
-
Jang, D.1
Li, X.2
Gao, H.3
Greer, J.R.4
-
6
-
-
0035441752
-
Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling
-
R.M. Langford and A.K. Petford-Long: Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling. J. Vac. Sci. Technol, A 19, 2186 (2001).
-
(2001)
J. Vac. Sci. Technol, A
, vol.19
, pp. 2186
-
-
Langford, R.M.1
Petford-Long, A.K.2
-
7
-
-
0000355331
-
Site-specific transmission electron microscope characterization of micrometer-sized particles using the focused ion beam lift-out technique
-
J.K. Lomness, L.A. Giannuzzi, and M.D. Hampton: Site-specific transmission electron microscope characterization of micrometer-sized particles using the focused ion beam lift-out technique. Microsc. Microanal. 7, 418-423 (2001).
-
(2001)
Microsc. Microanal.
, vol.7
, pp. 418-423
-
-
Lomness, J.K.1
Giannuzzi, L.A.2
Hampton, M.D.3
-
8
-
-
34249785085
-
TEM sample preparation and FIB-induced damage
-
J. Mayer, L.A. Giannuzzi, T. Kamino, and J. Michael: TEM sample preparation and FIB-induced damage. MRS Bull. 32, 400-407 (2007).
-
(2007)
MRS Bull.
, vol.32
, pp. 400-407
-
-
Mayer, J.1
Giannuzzi, L.A.2
Kamino, T.3
Michael, J.4
-
9
-
-
84868382777
-
Advanced electron microscopy for advanced materials
-
G. Van Tendeloo, S. Bals, S. Van Aert, J. Verbeeck, and D. Van Dyck: Advanced electron microscopy for advanced materials. Adv. Mater. 24, 5655-5675 (2012).
-
(2012)
Adv. Mater.
, vol.24
, pp. 5655-5675
-
-
Van Tendeloo, G.1
Bals, S.2
Van Aert, S.3
Verbeeck, J.4
Van Dyck, D.5
-
11
-
-
84857698901
-
High-resolution three-dimensional probes of biomaterials and their interfaces
-
K. Grandfield, A. Palmquist, and H. Engqvist: High-resolution three-dimensional probes of biomaterials and their interfaces. Philos. Trans. R. Soc. London, Ser. A 370, 1337-1351 (2012).
-
(2012)
Philos. Trans. R. Soc. London, Ser. A
, vol.370
, pp. 1337-1351
-
-
Grandfield, K.1
Palmquist, A.2
Engqvist, H.3
-
12
-
-
0032020292
-
High spatial resolution 3D analysis of materials using gallium focused ion beam secondary ion mass spectrometry (FIB SIMS)
-
B. Tomiyasu, I. Fukuju, H. Komatsubara, M. Owari, and Y. Nihei: High spatial resolution 3D analysis of materials using gallium focused ion beam secondary ion mass spectrometry (FIB SIMS). Nucl. Instrum. Methods Phys. Res., Sect. B 136-138, 1028-1033 (1998).
-
(1998)
Nucl. Instrum. Methods Phys. Res., Sect. B
, vol.136-138
, pp. 1028-1033
-
-
Tomiyasu, B.1
Fukuju, I.2
Komatsubara, H.3
Owari, M.4
Nihei, Y.5
-
13
-
-
14844330221
-
Structural studies by electron tomography: From cells to molecules
-
V. Lucic, F. Förster, and W. Baumeister: Structural studies by electron tomography: From cells to molecules. Annu. Rev. Biochem. 74, 833-865 (2005).
-
(2005)
Annu. Rev. Biochem.
, vol.74
, pp. 833-865
-
-
Lucic, V.1
Förster, F.2
Baumeister, W.3
-
14
-
-
0034299393
-
Three-dimensional transmission electron microscopy: A novel imaging and characterization technique with nanometer scale resolution for materials science
-
A.J. Koster, U. Ziese, A.J. Verkleij, A.H. Janssen, and K.P. de Jong: Three-dimensional transmission electron microscopy: A novel imaging and characterization technique with nanometer scale resolution for materials science. J. Phys. Chem. B 104, 9368-9370 (2000).
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 9368-9370
-
-
Koster, A.J.1
Ziese, U.2
Verkleij, A.J.3
Janssen, A.H.4
De Jong, K.P.5
-
15
-
-
33845363910
-
A new approach for electron tomography: Annular dark-field transmission electron microscopy
-
S. Bals, G Van Tendeloo, and C. Kisielowski: A new approach for electron tomography: Annular dark-field transmission electron microscopy. Adv. Mater. 18, 892-895 (2006).
-
(2006)
Adv. Mater.
, vol.18
, pp. 892-895
-
-
Bals, S.1
Van Tendeloo, G.2
Kisielowski, C.3
-
17
-
-
33745644044
-
Size effects in the nanoindentation of silicon at ambient temperature
-
D. Ge, A. Minor, E. Stach, and J. Morris: Size effects in the nanoindentation of silicon at ambient temperature. Philos. Mag. 86, 4069-4080 (2006).
-
(2006)
Philos. Mag.
, vol.86
, pp. 4069-4080
-
-
Ge, D.1
Minor, A.2
Stach, E.3
Morris, J.4
-
18
-
-
3042790455
-
Structural damage in boron carbide under contact loading
-
D. Ge, V. Domnich, T. Juliano, E. Stach, and Y. Gogotsi: Structural damage in boron carbide under contact loading. Acta Mater. 52, 3921-3927 (2004).
-
(2004)
Acta Mater.
, vol.52
, pp. 3921-3927
-
-
Ge, D.1
Domnich, V.2
Juliano, T.3
Stach, E.4
Gogotsi, Y.5
-
19
-
-
58149231262
-
Thickness-dependent phase transformation in nanoindented germanium thin films
-
D.J. Oliver, J.E. Bradby, J.S. Williams, M.V. Swain, and P.P. Munroe: Thickness-dependent phase transformation in nanoindented germanium thin films. Nanotechnology 19, 475709 (2008).
-
(2008)
Nanotechnology
, vol.19
, pp. 475709
-
-
Oliver, D.J.1
Bradby, J.E.2
Williams, J.S.3
Swain, M.V.4
Munroe, P.P.5
-
20
-
-
2942669481
-
Fracture and deformation in brittle solids: A perspective on the issue of scale
-
B. Lawn: Fracture and deformation in brittle solids: A perspective on the issue of scale. J. Mater. Res. 19, 22-29 (2004).
-
(2004)
J. Mater. Res.
, vol.19
, pp. 22-29
-
-
Lawn, B.1
|