Yield strength predictions from the plastic zone around nanocontacts

Acta Materialia

Volumn 47, Issue 1, 1998, Pages 333-343

  Kramer, D ^a   Huang, H ^a,b   Kriese, M ^a   Robach, J ^a   Nelson, J ^a   Wright, A ^a   Bahr, D ^a,c   Gerberich, W W ^a  

^a University of Minnesota   (United States)

^b HGST Western Digital Company   (United States)

^c WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001035841     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00301-2     Document Type: Article

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