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Applied Physics A: Materials Science and Processing

Volumn 112, Issue 3, 2013, Pages 701-710

Oxidation of bismuth nanodroplets deposit on GaAs substrate

(4) Fitouri, H a Boussaha, R a Rebey, A a El Jani, B a

a FACULTÉ DES SCIENCES DE MONASTIR (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; DIFFRACTION ANALYSIS; ENERGY DISPERSIVE X-RAY; METAL-ORGANIC VAPOR PHASE EPITAXY; OXIDATION TEMPERATURE; PHOTOLUMINESCENCE SPECTRUM; REFRACTIVE INDEX VARIATIONS; THE SCANNING ELECTRON MICROSCOPES (SEM);

ANNEALING; BISMUTH; METALLORGANIC VAPOR PHASE EPITAXY; OXYGEN; REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

GALLIUM ARSENIDE;

EID: 84881310750 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-013-7759-3 Document Type: Article

Times cited : (5)

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