Structure, microstructure and optical properties of cerium oxide thin films prepared by electron beam evaporation assisted with ion beams

Solid State Sciences

Volumn 11, Issue 8, 2009, Pages 1456-1464

  Mansilla, Catalina ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

Band gap; CeO2; Grain size; Refractive index; SEM; XPS; XRD

Indexed keywords

BAND GAP; CEO2; GRAIN SIZE; SEM; XPS; XRD;

CERIUM; CERIUM COMPOUNDS; DEPOSITION; ELECTRON BEAMS; ENERGY GAP; EVAPORATION; FILM GROWTH; FILM PREPARATION; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; ION BEAM ASSISTED DEPOSITION; ION BEAMS; IONS; LATTICE CONSTANTS; LIGHT REFRACTION; MICROSTRUCTURE; OXIDE FILMS; OXIDES; REFRACTIVE INDEX; REFRACTOMETERS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; VAPORS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTEGRATED OPTOELECTRONICS;

EID: 67650720448     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2009.05.001     Document Type: Article

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