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Volumn 248, Issue 4-6, 2005, Pages 459-467
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Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
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Author keywords
Ellipsometry; EMA; Roughness; RRT
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Indexed keywords
APPROXIMATION THEORY;
ATOMIC FORCE MICROSCOPY;
DATA REDUCTION;
ELLIPSOMETRY;
FREQUENCIES;
LIGHT SCATTERING;
PARAMETER ESTIMATION;
THICKNESS MEASUREMENT;
EFFECTIVE MEDIUM APPROXIMATION (EMA);
POWER DENSITY (PD);
RAYLEIGH-RICE THEORY (RRT);
THICKNESS VALUE;
SURFACE ROUGHNESS;
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EID: 16244380499
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optcom.2004.12.016 Document Type: Article |
Times cited : (83)
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References (32)
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