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Volumn 248, Issue 4-6, 2005, Pages 459-467

Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces

Author keywords

Ellipsometry; EMA; Roughness; RRT

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; DATA REDUCTION; ELLIPSOMETRY; FREQUENCIES; LIGHT SCATTERING; PARAMETER ESTIMATION; THICKNESS MEASUREMENT;

EID: 16244380499     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.12.016     Document Type: Article
Times cited : (83)

References (32)
  • 18
    • 0038695308 scopus 로고    scopus 로고
    • E. Wolf North-Holland Amsterdam
    • I. Ohlídal, and D. Franta E. Wolf Progress in Optics vol. 41 2000 North-Holland Amsterdam 181 282
    • (2000) Progress in Optics , vol.41 , pp. 181-282
    • Ohlídal, I.1    Franta, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.