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Volumn 80, Issue 12, 1996, Pages 7023-7027
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Optical properties of pulsed laser deposited bismuth films
a,c b b |
Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH;
ELLIPSOMETRY;
METALLIC FILMS;
OPTICAL PROPERTIES;
OPTICAL VARIABLES MEASUREMENT;
PULSED LASER APPLICATIONS;
REFRACTIVE INDEX;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON;
SUBSTRATES;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
ACOUSTOOPTIC MODULATOR;
DC SPUTTERING;
PULSED LASER DEPOSITED BISMUTH FILMS;
PULSED LASER MELTING;
RUTHERFORD BACKSCATTERING SPECTROMETRY;
SPECTROSCOPIC ELLIPSOMETRY;
THIN FILMS;
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EID: 0030379811
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.363775 Document Type: Article |
Times cited : (51)
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References (19)
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