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Volumn 80, Issue 12, 1996, Pages 7023-7027

Optical properties of pulsed laser deposited bismuth films

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; ELLIPSOMETRY; METALLIC FILMS; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; PULSED LASER APPLICATIONS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; SUBSTRATES; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030379811     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363775     Document Type: Article
Times cited : (51)

References (19)
  • 10
    • 0002345052 scopus 로고
    • edited by D. B. Chrisey and G. K. Hubler Wiley, New York
    • J. C. S. Kools, in Pulsed laser deposition of thin films, edited by D. B. Chrisey and G. K. Hubler (Wiley, New York, 1994), p. 455.
    • (1994) Pulsed Laser Deposition of Thin Films , pp. 455
    • Kools, J.C.S.1
  • 18
    • 85033813886 scopus 로고    scopus 로고
    • L.-C. Chen, in Ref. 10, p 167.
    • L.-C. Chen, in Ref. 10, p. 167.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.