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Volumn 48, Issue 11, 2013, Pages 3943-3949

Structural, chemical, and optical properties of tin sulfide thin films as controlled by the growth temperature during co-evaporation and subsequent annealing

(4) Robles, V a Trigo, J F a Guillen C a Herrero, J a

a CIEMAT (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; ENERGY BANDGAPS; ENERGY DISPERSIVE ANALYSIS OF X-RAYS; EXTINCTION COEFFICIENT (K); SCANNING ELECTRON MICROSCOPE; SODA LIME GLASS SUBSTRATE; SUBSTRATE TEMPERATURE; TRANSMITTANCE AND REFLECTANCES;

ENERGY GAP; EVAPORATION; PHASE TRANSITIONS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TIN; X RAY DIFFRACTION;

THIN FILMS;

EID: 84880571230 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-013-7198-8 Document Type: Article

Times cited : (36)

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