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Volumn 520, Issue 2, 2011, Pages 837-841
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Physical properties of very thin SnS films deposited by thermal evaporation
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Author keywords
Physical properties; Thermal evaporation; Very thin SnS films
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Indexed keywords
DEPOSITED FILMS;
GLASS SUBSTRATES;
ROOM TEMPERATURE;
SMOOTH SURFACE;
SNS FILMS;
XRD;
NEAR INFRARED SPECTROSCOPY;
PHASE TRANSITIONS;
PHOTOELECTRON SPECTROSCOPY;
PHYSICAL PROPERTIES;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
TIN;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
THERMAL EVAPORATION;
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EID: 80755135564
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.01.355 Document Type: Conference Paper |
Times cited : (101)
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References (15)
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