SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 519, Issue 21, 2011, Pages 7425-7428

Annealing studies and electrical properties of SnS-based solar cells

(5) Ogah, Ogah E a Reddy, Kotte Ramakrishna b Zoppi, Guillaume a Forbes, Ian a Miles, Robert W a

a NORTHUMBRIA UNIVERSITY (United Kingdom)

b SRI VENKATESWARA UNIVERSITY (India)

Author keywords

Absorber layers; SnS; Solar cells; Thermal evaporation; Tin sulphide

Indexed keywords

ABSORBER LAYERS; BACK CONTACT; CAPACITANCE VOLTAGE; CDS; COATED GLASS SUBSTRATES; DEVICE STRUCTURES; ENERGY DISPERSIVE X-RAY; FABRICATED DEVICE; IN-VACUUM; INDIUM TIN OXIDE; PHOTOVOLTAIC SOLAR CELLS; SNS; SPECTRAL RESPONSE; SUPERSTRATES; TIN SULPHIDE; TRANSPARENT CONDUCTIVE OXIDES; WAVELENGTH MEASUREMENT;

CADMIUM; CAPACITANCE; CHEMICAL ANALYSIS; GLASS; INDIUM COMPOUNDS; NANOSTRUCTURED MATERIALS; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THERMAL EVAPORATION; TIN; TIN OXIDES; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SOLAR POWER GENERATION;

EID: 80052162536 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.12.235 Document Type: Conference Paper

Times cited : (65)

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