Assessment of the potential of tin sulphide thin films prepared by sulphurization of metallic precursors as cell absorbers

Thin Solid Films

Volumn 519, Issue 21, 2011, Pages 7416-7420

  Malaquias, J ^a   Fernandes, P A ^a,b   Salome P M P ^a   Da Cunha, A F ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b INSTITUTO SUPERIOR DE ENGENHARIA DO PORTO   (Portugal)

Author keywords

Solar cell; Sulphurization; Thin film; Tin sulphide

Indexed keywords

DIRECT TRANSITION; ELECTRICAL CHARACTERIZATION; ENERGY BANDGAPS; HOT POINT; INDIRECT TRANSITION; METALLIC PRECURSOR; OPTICAL MEASUREMENT; P TYPE SEMICONDUCTOR; REFLECTANCE SPECTRUM; SODA LIME GLASS SUBSTRATE; SOLAR CELL EFFICIENCIES; SULPHURIZATION; TIN SULPHIDE; ZNO;

ENERGY DISPERSIVE SPECTROSCOPY; OPTICAL DATA PROCESSING; RAMAN SPECTROSCOPY; SUBSTRATES; SULFUR; TIN; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

THIN FILMS;

EID: 80052165537     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.01.393     Document Type: Conference Paper

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