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Volumn 85, Issue 2, 2005, Pages 153-165

Characterization of electrical properties and photosensitivity of SnS thin films prepared by the electrochemical deposition method

(4) Sato, Naoya a Ichimura, Masaya a Arai, Eisuke a Yamazaki, Yoshihisa b

a NAGOYA INSTITUTE OF TECHNOLOGY (Japan)

b FUJI XEROX CO LTD (Japan)

Author keywords

Electrochemical deposition; Photoelectrochemical measurements; Pulse form biasing; Resistivity; Tin sulfide

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRIC CONDUCTANCE; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; ELECTROCHEMISTRY; ELECTRODEPOSITION; ENERGY GAP; PHOTOCONDUCTIVITY; PHOTOSENSITIVITY; SOLAR CELLS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ABSORPTION LAYERS; BANDGAP ENERGY; ELECTROCHEMICAL DEPOSITION; PHOTOELECTROCHEMICAL MEASUREMENTS;

TIN COMPOUNDS;

EID: 9544219706 PISSN: 09270248 EISSN: None Source Type: Journal
DOI: 10.1016/j.solmat.2004.04.014 Document Type: Article

Times cited : (124)

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