Electronic dielectric constants of thermally evaporated SnS thin films

Optical Materials

Volumn 24, Issue 3, 2003, Pages 555-561

  Abou Shama, A ^a   Zeyada, H M ^b  

^a Ain Shams University   (Egypt)

^b Faculty of Science at New Damietta   (Egypt)

Author keywords

Dielectric constants; SnS; Thin films

Indexed keywords

AMORPHOUS FILMS; CRYSTALLINE MATERIALS; ENERGY GAP; PERMITTIVITY; SPECTROPHOTOMETERS; TIN COMPOUNDS;

DISPERSION ENERGY;

THIN FILMS;

EID: 0142125698     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(03)00138-1     Document Type: Article

References (19)

1. El-Nhaas M.M., Zeyada H.M., Aziz M.S., El-ghamaz N.A. J. Opt. Mater. 20(3):2002;159.
2. Joseph C.M., Menon C.S. J. Phys. D: Appl. Phys. 34:2001;1143.
3. Thangaraju B., Kaliannan P. Semicond. Sci. Technol. 15:2000;849.
4. Soliman H.S. J. Phys. D: Appl. Phys. 31:1998;1516.
5. Ibrahim A.M. J. Phys.: Condens. Matter. 7:1995;5931.
6. AbdulGhafour W.A.S., Majdi K.S. J. Phys.: Condens. Matter. 2:1990;6619.
7. George J., Joseph K.S. J. Phys. D: Appl. Phys. 16:1983;33.
8. Nikolic P.M., Vujatovic S.S., Todorvic D.M. J. Phys. C: Solid State Phys. 19:1986;L717.
9. Chopra K.I., Major S., Pandy D.K. Thin Solid Films. 102:1983;1.
10. ICDD card no. 39-354.
11. Van Vechten J.A. Phys. Rev. 182:1969;891.
12. Wemple S.H., Di Domenico M. Phys. Rev. B. 3(4):1971;1338.
13. Kawano K., Nakata R., Sumita M. J. Phys. D: Appl. Phys. 22:1989;136.
14. Tauc J., Grigorovici R., Vancu A. Phys. Stat. Sol. 15:1966;627.
15. Adachi S.A. Phys. Rev. B. 43:1991;12316.
16. Tanaka K.E. Thin Solid Films. 66:1980;271.
17. Wemple S.H., Di Domenico M. Phys. Rev. Lett. 23(20):1969;1156.
18. Wemple S.H. Phys. Rev. B. 7:1973;3767.
19. Elkorashy A.M. Phys. Stat. Sol. (b). 159:1991.