Controlling tetragonality and crystalline orientation in BaTiO3 nano-layers grown on Si

Nanotechnology

Volumn 24, Issue 28, 2013, Pages

  Abel, S ^a   Sousa, M ^a   Rossel, C ^a   Caimi, D ^a   Rossell, M D ^b   Erni, R ^b   Fompeyrine, J ^a   Marchiori, C ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE ORIENTATIONS; CRYSTALLINE STRUCTURE; CRYSTALLINE SYMMETRY; FUNCTIONAL PROPERTIES; PIEZOFORCE MICROSCOPY; RADIO FREQUENCY SPUTTERING; SEED LAYER THICKNESS; SPONTANEOUS POLARIZATIONS;

CRYSTALLINE MATERIALS; DEPOSITION; EPITAXIAL FILMS; EPITAXIAL GROWTH; FERROELECTRIC FILMS; MOLECULAR BEAM EPITAXY; SILICON; SUBSTRATES; THICK FILMS;

BARIUM COMPOUNDS;

EID: 84879481302     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/28/285701     Document Type: Article

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