SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 24, Issue 7, 2013, Pages 2541-2547

Effect of growth temperature on structural, electrical and optical properties of dual ion beam sputtered ZnO thin films

(8) Pandey, Sushil Kumar a Pandey, Saurabh Kumar a Mukherjee, C b Mishra, P b Gupta, M c Barman, S R c D'Souza, S W c Mukherjee, Shaibal a

a INDIAN INSTITUTE OF TECHNOLOGY INDORE (India)

b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY (India)

c UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH (India)

Author keywords

[No Author keywords available]

Indexed keywords

DUAL ION BEAM SPUTTERING; ELECTRICAL AND OPTICAL PROPERTIES; NEAR BAND EDGE EMISSIONS; OPTICAL AND ELECTRICAL PROPERTIES; PHOTOLUMINESCENCE MEASUREMENTS; PREFERRED ORIENTATIONS; VISIBLE SPECTRAL RANGE; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

GROWTH TEMPERATURE; METALLIC FILMS; OPTICAL CORRELATION; OPTICAL FILMS; OPTICAL PROPERTIES; OXYGEN; PHOTOELECTRONS; POINT DEFECTS; SUBSTRATES; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

ELECTRIC PROPERTIES;

EID: 84879415994 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-013-1130-5 Document Type: Article

Times cited : (67)

References (36)

1
- 0035932264
- 10.1016/S0921-5107(00)00604-8
- D.C. Look, Mater. Sci. Eng. B 80, 383 (2001)
- (2001) Mater. Sci. Eng. , vol.80 , pp. 383
- Look, D.C.¹

2
- 0030243118
- 10.1016/0038-1098(96)00340-7 1:CAS:528:DyaK28XlsF2msLc%3D
- D.C. Reynolds, D.C. Look, B. Jogai, Solid State Commun. 99, 873 (1996)
- (1996) Solid State Commun. , vol.99 , pp. 873
- Reynolds, D.C.¹ Look, D.C.² Jogai, B.³

3
- 6444220325
- 10.1016/j.pmatsci.2004.04.001 1:CAS:528:DC%2BD2cXovFWrsbc%3D
- S.J. Pearton, D.P. Norton, K. Ip, Y.W. Heo, T. Steiner, Prog. Mater Sci. 50, 293 (2005)
- (2005) Prog. Mater Sci. , vol.50 , pp. 293
- Pearton, S.J.¹ Norton, D.P.² Ip, K.³ Heo, Y.W.⁴ Steiner, T.⁵

4
- 11044222901
- 10.1063/1.1825615 1:CAS:528:DC%2BD2cXhtVCqs7vE
- D.C. Look, G.M. Renlund, R.H. Burgeber II, J.R. Sizelove, Appl. Phys. Lett. 85, 5269 (2004)
- (2004) Appl. Phys. Lett. , vol.85 , pp. 5269
- Look, D.C.¹ Renlund, G.M.² Burgeber, I.I.R.H.³ Sizelove, J.R.⁴

5
- 24144443526
- 10.1063/1.1991994
- T. Makino, Y. Segawa, A. Tsukazaki, A. Ohtomo, M. Kawasaki, Appl. Phys. Lett. 87, 022101 (2005)
- (2005) Appl. Phys. Lett. , vol.87 , pp. 022101
- Makino, T.¹ Segawa, Y.² Tsukazaki, A.³ Ohtomo, A.⁴ Kawasaki, M.⁵

6
- 0037258011
- 10.1063/1.1517164 1:CAS:528:DC%2BD38XpvVaqt7Y%3D
- S.J. Pearton, C.R. Abernathy, M.E. Overberg, G.T. Thaler, D.P. Norton, J. Appl. Phys. 93, 1 (2003)
- (2003) J. Appl. Phys. , vol.93 , pp. 1
- Pearton, S.J.¹ Abernathy, C.R.² Overberg, M.E.³ Thaler, G.T.⁴ Norton, D.P.⁵

7
- 0031994210
- 10.1016/S0038-1098(97)10145-4
- D.C. Look, D.C. Reynolds, J.R. Sizelove, R.L. Jones, C.W. Litton, G. Cantwell, W.C. Harsch, Solid State Commun. 105, 39 (1998)
- (1998) Solid State Commun. , vol.105 , pp. 39
- Look, D.C.¹ Reynolds, D.C.² Sizelove, J.R.³ Jones, R.L.⁴ Litton, C.W.⁵ Cantwell, G.⁶ Harsch, W.C.⁷

8
- 18244430368
- 10.1103/PhysRevLett.85.1012
- C.G. Van de Walle, Phys. Rev. Lett. 85, 1012 (2000)
- (2000) Phys. Rev. Lett. , vol.85 , pp. 1012
- Van De Walle, C.G.¹

9
- 0017949304
- 10.1063/1.325059 1:CAS:528:DyaE1cXhvVWju7o%3D
- E.G. Bylander, J. Appl. Phys. 49, 1188 (1978)
- (1978) J. Appl. Phys. , vol.49 , pp. 1188
- Bylander, E.G.¹

10
- 0029774658
- 10.1063/1.116699 1:CAS:528:DyaK28Xkt1CgtQ%3D%3D
- K. Vanheusden, C.H. Seager, W.L. Warren, D.R. Tallant, J.A. Voiget, Appl. Phys. Lett. 68, 403 (1996)
- (1996) Appl. Phys. Lett. , vol.68 , pp. 403
- Vanheusden, K.¹ Seager, C.H.² Warren, W.L.³ Tallant, D.R.⁴ Voiget, J.A.⁵

11
- 84874781363
- M. Liu, A.H. Kitai, P. Mascher, J. Lumin. 54, 3 (1992)
- (1992) J. Lumin. , vol.54 , pp. 3
- Liu, M.¹ Kitai, A.H.² Mascher, P.³

12
- 0035855080
- 10.1063/1.1394173 1:CAS:528:DC%2BD3MXlvVeju7Y%3D
- B. Lin, Z. Fu, Y. Zia, Appl. Phys. Lett. 79, 943 (2001)
- (2001) Appl. Phys. Lett. , vol.79 , pp. 943
- Lin, B.¹ Fu, Z.² Zia, Y.³

13
- 71749110899
- 10.1016/j.apsusc.2009.08.061
- Yu. Chang-Feng, Che-Wei Sung, Sy-Hann Chen, Shih-Jye Sun, Appl. Surf. Sci. 256, 792 (2009)
- (2009) Appl. Surf. Sci. , vol.256 , pp. 792
- Chang-Feng, Y.¹ Sung, C.-W.² Chen, S.-H.³ Sun, S.-J.⁴

14
- 17344380939
- 10.1016/S0169-4332(00)00751-0
- B.J. Jina, H.S. Woo, S. Im, S.H. Bae, S.Y. Lee, Appl. Surf. Sci. 169-170, 521 (2001)
- (2001) Appl. Surf. Sci. , vol.169-170 , pp. 521
- Jina, B.J.¹ Woo, H.S.² Im, S.³ Bae, S.H.⁴ Lee, S.Y.⁵

15
- 84879419494
- Jun-Liang Zhao, Xiao-Min Li, Ji-Ming Bian, Wei-Dong Yu, Xiang-Dong Gao, J. Cryst. Growth 276, 50 (2005)
- (2005) J. Cryst. Growth , vol.276 , pp. 50
- Zhao, J.-L.¹ Li, X.-M.² Bian, J.-M.³ Yu, W.-D.⁴ Gao, X.-D.⁵

16
- 84879410134
- J. Lee, W. Gao, Z. Li, M. Hodgson, J. Metson, H. Gong, U. Pal, Appl. Phys. A 80, 164 (2005)
- (2005) Appl. Phys. A , vol.80 , pp. 164
- Lee, J.¹ Gao, W.² Li, Z.³ Hodgson, M.⁴ Metson, J.⁵ Gong, H.⁶ Pal, U.⁷

17
- 0033895982
- 10.1016/S0921-5107(99)00395-5
- B.J. Jin, S.H. Bae, S.Y. Lee, S. Im, Mater. Sci. Eng., B 71, 301 (2000)
- (2000) Mater. Sci. Eng., B , vol.71 , pp. 301
- Jin, B.J.¹ Bae, S.H.² Lee, S.Y.³ Im, S.⁴

18
- 84874766584
- Design and growth optimization by dual ion beam sputtering of ZnO-based high-efficiency multiple quantum well green light emitting diode
- Singapore
- S.K. Pandey, S. K. Pandey, S. Mukherjee, Design and growth optimization by dual ion beam sputtering of ZnO-based high-efficiency multiple quantum well green light emitting diode, 5th IEEE International Nanoelectronics Conference, IEEE INEC 2013, Singapore (2013)
- (2013) 5th IEEE International Nanoelectronics Conference, IEEE INEC 2013
- Pandey, S.K.¹ Pandey, S.K.² Mukherjee, S.³

19
- 84879417848
- American Standard for Testing of Materials (ASTM) 36-1451
- American Standard for Testing of Materials (ASTM) 36-1451

20
- 47549092743
- 10.1016/j.apsusc.2008.04.012 1:CAS:528:DC%2BD1cXptVWhtb4%3D
- R. Kumar, N. Khare, V. Kumar, G.L. Bhalla, Appl. Surf. Sci. 254, 6509 (2008)
- (2008) Appl. Surf. Sci. , vol.254 , pp. 6509
- Kumar, R.¹ Khare, N.² Kumar, V.³ Bhalla, G.L.⁴

21
- 0003427458
- 2 Addison-Wesley Reading, MA
- B.D. Cullity, Elements of X-ray diffraction, 2nd edn. (Addison-Wesley, Reading, MA, 1979)
- (1979) Elements of X-ray Diffraction
- Cullity, B.D.¹

22
- 5844272071
- 10.1116/1.580437 1:CAS:528:DyaK2sXktFSht78%3D
- Y.J. Kim, Y.T. Kim, H.K. Yang, J.C. Park, I. Han, Y.E. Lee, H.J. Kim, Vac. Sci. Technol. 15, 1103 (1997)
- (1997) Vac. Sci. Technol. , vol.15 , pp. 1103
- Kim, Y.J.¹ Kim, Y.T.² Yang, H.K.³ Park, J.C.⁴ Han, I.⁵ Lee, Y.E.⁶ Kim, H.J.⁷

23
- 37149037688
- 10.1063/1.2817255
- J.P. Zhang, L.D. Zhang, L.Q. Zhu, Y. Zhang, M. Liu, X.J. Wang, J. Appl. Phys. 102, 114903 (2007)
- (2007) J. Appl. Phys. , vol.102 , pp. 114903
- Zhang, J.P.¹ Zhang, L.D.² Zhu, L.Q.³ Zhang, Y.⁴ Liu, M.⁵ Wang, X.J.⁶

24
- 0031191917
- 10.1016/S0022-2313(96)00096-8 1:CAS:528:DyaK2sXksFeitbg%3D
- K. Vanheusden, C.H. Seager, W.L. Warren, D.R. Trallant, J. Caruso, M.J. Hampden-Smith, T.T. Kodas, J. Lumin. 75, 11 (1997)
- (1997) J. Lumin. , vol.75 , pp. 11
- Vanheusden, K.¹ Seager, C.H.² Warren, W.L.³ Trallant, D.R.⁴ Caruso, J.⁵ Hampden-Smith, M.J.⁶ Kodas, T.T.⁷

25
- 24444480986
- F.H. Leiter, H.R. Alves, A. Hofstaetter, D.M. Hofmann, B.K. Meyer, Phys. Stat. Sol. B R4, 226 (2001)
- (2001) Phys. Stat. Sol. B , vol.4 , pp. 226
- Leiter, F.H.¹ Alves, H.R.² Hofstaetter, A.³ Hofmann, D.M.⁴ Meyer, B.K.⁵

26
- 36849123865
- 10.1063/1.1740044 1:CAS:528:DyaG2cXjtFKhtw%3D%3D
- F.A. Kroger, H.J. Vink, J. Chem. Phys. 22, 250 (1954)
- (1954) J. Chem. Phys. , vol.22 , pp. 250
- Kroger, F.A.¹ Vink, H.J.²

27
- 0005820442
- 10.1063/1.368295 1:CAS:528:DyaK1cXkvVOhsL4%3D
- S.A. Studenikin, N. Golego, M. Cocivera, J. Appl. Phys. 84, 2287 (1998)
- (1998) J. Appl. Phys. , vol.84 , pp. 2287
- Studenikin, S.A.¹ Golego, N.² Cocivera, M.³

28
- 0002081496
- 10.1063/1.362349 1:CAS:528:DyaK28XivFeqsr8%3D
- K. Vanheusden, W.L. Warren, C.H. Seager, D.R. Trallant, J.A. Voigt, J. Appl. Phys. 79, 7983 (1996)
- (1996) J. Appl. Phys. , vol.79 , pp. 7983
- Vanheusden, K.¹ Warren, W.L.² Seager, C.H.³ Trallant, D.R.⁴ Voigt, J.A.⁵

29
- 0031102020
- 10.1143/JJAP.36.L289 1:CAS:528:DyaK2sXitFajtLo%3D
- T. Sekiguchi, N. Ohashi, Y. Terada, Jpn. J. Appl. Phys. 36, L289 (1997)
- (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 289
- Sekiguchi, T.¹ Ohashi, N.² Terada, Y.³

30
- 18244430368
- 10.1103/PhysRevLett.85.1012
- C.G. Van de Walle, Phys. Rev. Lett. 85, 1012 (2000)
- (2000) Phys. Rev. Lett. , vol.85 , pp. 1012
- Van De Walle, C.G.¹

31
- 0037109976
- 10.1103/PhysRevB.66.165205
- E.V. Lavrov, J. Weber, F. Borrnert, C.G. Van de Wall, R. Helbig, Phys. Rev. B 66, 165205 (2002)
- (2002) Phys. Rev. B , vol.66 , pp. 165205
- Lavrov, E.V.¹ Weber, J.² Borrnert, F.³ Van De Wall, C.G.⁴ Helbig, R.⁵

32
- 84879410365
- Z.W. Liu, C.K. Ong, Appl. Phys. Lett. 88, 05311 (2006)
- (2006) Appl. Phys. Lett. , vol.88 , pp. 05311
- Liu, Z.W.¹ Ong, C.K.²

33
- 77949918946
- 10.1016/j.physb.2010.02.016 1:CAS:528:DC%2BC3cXkt1OgsrY%3D
- T.P. Rao, M.C.S. Kumar, A. Safarulla, V. Ganesan, S.R. Barman, C. Sanjeeviraja, Phys. B 405, 2226 (2010)
- (2010) Phys. B , vol.405 , pp. 2226
- Rao, T.P.¹ Kumar, M.C.S.² Safarulla, A.³ Ganesan, V.⁴ Barman, S.R.⁵ Sanjeeviraja, C.⁶

34
- 0030194256
- 10.1016/0040-6090(95)08239-5 1:CAS:528:DyaK28XltVyhu7Y%3D
- M.N. Islam, T.B. Ghosh, K.L. Chopra, H.N. Acharya, Thin Solid Films 280, 20 (1996)
- (1996) Thin Solid Films , vol.280 , pp. 20
- Islam, M.N.¹ Ghosh, T.B.² Chopra, K.L.³ Acharya, H.N.⁴

35
- 34548691844
- 10.1088/0256-307X/24/7/089 1:CAS:528:DC%2BD2sXos1Kjur8%3D
- H.B. Fan, S.Y. Yang, P.F. Zhang, H.Y. Wei, X.L. Liu, C.M. Jiao, Q.S. Zhu, Y.H. Chen, Z.G. Wang, Chin. Phys. Lett. 24, 2108 (2007)
- (2007) Chin. Phys. Lett. , vol.24 , pp. 2108
- Fan, H.B.¹ Yang, S.Y.² Zhang, P.F.³ Wei, H.Y.⁴ Liu, X.L.⁵ Jiao, C.M.⁶ Zhu, Q.S.⁷ Chen, Y.H.⁸ Wang, Z.G.⁹

36
- 60349091512
- 10.1002/adma.200801470
- S.H.K. Park, C.S. Hwang, M. Ryu, S. Yang, C. Byun, J. Shin, J.I. Lee, M.S. Oh, S. Im, Adv. Mater. 2, 678 (2009)
- (2009) Adv. Mater. , vol.2 , pp. 678
- Park, S.H.K.¹ Hwang, C.S.² Ryu, M.³ Yang, S.⁴ Byun, C.⁵ Shin, J.⁶ Lee, J.I.⁷ Oh, M.S.⁸ Im, S.⁹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.