XPS and X-ray diffraction studies of aluminum-doped zinc oxide transparent conducting films

Thin Solid Films

Volumn 280, Issue 1-2, 1996, Pages 20-25

  Islam, Md Nurum ^a   Ghosh, T B ^b   Chopra, K L ^b   Acharya, H N ^b  

^a UNIVERSITY OF CHITTAGONG   (Bangladesh)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

X ray diffraction; X ray photoelectron spectroscopy; Zinc oxide

Indexed keywords

ALUMINUM; DOPING (ADDITIVES); LATTICE CONSTANTS; PYROLYSIS; THIN FILMS; TRANSPARENCY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

CORE ELECTRON LINE SHAPE; DOPANT CONCENTRATIONS; PHOTOELECTRON PEAKS; SPRAY PYROLYSIS;

CONDUCTIVE FILMS;

EID: 0030194256     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08239-5     Document Type: Article

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