Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution

Nanotechnology

Volumn 24, Issue 22, 2013, Pages

  Maragliano, C ^a   Heskes, D ^a   Stefancich, M ^a   Chiesa, M ^a   Souier, T ^a  

^a KHALIFA UNIVERSITY   (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATED; CONFINED STRUCTURES; ELECTROSTATIC CONTRIBUTIONS; ELECTROSTATIC FORCE MICROSCOPY; LOCAL WORK FUNCTION; SPATIAL RESOLUTION; THEORETICAL MODELS; TIP-SAMPLE DISTANCE;

ELECTRIC FORCE MICROSCOPY; ELECTRIC VARIABLES MEASUREMENT; ELECTROSTATIC FORCE; NANORODS; SURFACE PROPERTIES;

ELECTRIC PROPERTIES;

EID: 84877740310     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/22/225703     Document Type: Article

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