Dynamics of small amplitude, off-resonance AFM

Applied Surface Science

Volumn 210, Issue 1-2 SPEC., 2003, Pages 140-145

  Hoffmann, Peter M ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Non contact AFM; Off resonance; Small amplitude

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ENERGY DISSIPATION; RESONANCE; STIFFNESS; VIBRATIONS (MECHANICAL);

ATOMIC RESOLUTION; NON-CONTACT TECHNIQUES;

SURFACE STRUCTURE;

EID: 0037474589     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01494-0     Document Type: Conference Paper

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