Simultaneous atomic force microscopy measurement of long range forces and adhesion energy between tungsten and oxide surfaces under ambient atmosphere and ultrahigh vacuum

Journal of Applied Physics

Volumn 85, Issue 1, 1999, Pages 222-227

  Sounilhac, S ^a   Barthel, E ^a   Creuzet, F ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000269215     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369474     Document Type: Article

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