Atomic-scale measurement of structure and chemistry of a single-unit-cell layer of LaAlO3 embedded in SrTiO3

Microscopy and Microanalysis

Volumn 19, Issue 2, 2013, Pages 310-318

  Jia, Chun Lin ^a,b   Barthel, Juri ^a,c   Gunkel, Felix ^a   Dittmann, Regina ^a   Hoffmann Eifert, Susanne ^a   Houben, Lothar ^a   Lentzen, Markus ^a   Thust, Andreas ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b XI'AN JIAOTONG UNIVERSITY   (China)

^c RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

aberration corrected transmission electron microscopy; atomic structure; interface; multilayer thin films; oxides

Indexed keywords

EID: 84875432979     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612014407     Document Type: Article

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