Spatial resolution and radiation damage in quantitative high-resolution STEM-EEL spectroscopy in oxides

Micron

Volumn 43, Issue 4, 2012, Pages 532-537

  Houben, L ^a   Heidelmann, M ^a   Gunkel, F ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Electron energy loss spectroscopy; Oxides; Radiation damage; Scanning transmission electron microscopy

Indexed keywords

ATOMIC COLUMNS; ATOMIC SCALE; ELECTRON DOSE; ELECTRON PROBE; HIGH RESOLUTION; IRRADIATION DOSE; NON DESTRUCTIVE; OXYGEN DEFECT; RADIATION DAMAGE EFFECTS; SAMPLE LOCATION; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL TO NOISE; SPATIAL DIMENSION; SPATIAL RESOLUTION; SPECTROSCOPIC SIGNALS; SRTIO; THICK LAYERS; UNIT CELLS; VALENCIES;

ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE RESOLUTION; IRRADIATION; OXIDES; STRONTIUM TITANATES; TRANSMISSION ELECTRON MICROSCOPY;

RADIATION DAMAGE;

EID: 84857359240     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.10.006     Document Type: Article

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