Defects and transport in complex oxide thin films

Journal of Applied Physics

Volumn 103, Issue 10, 2008, Pages

  Ohnishi, Tsuyoshi ^a   Shibuya, Keisuke ^a,b   Yamamoto, Takahisa ^a   Lippmaa, Mikk ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; LIGHT EMITTING DIODES; OXIDE FILMS; PULSED LASER DEPOSITION; STOICHIOMETRY; SWITCHING; TRANSPORT PROPERTIES;

COMPLEX OXIDE THIN FILMS; MATERIAL AGNOSTIC; SWITCHING MEMORIES;

THIN FILMS;

EID: 44649176374     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2921972     Document Type: Article

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