Advances in X-ray diffraction contrast tomography: Flexibility in the setup geometry and application to multiphase materials

Journal of Applied Crystallography

Volumn 46, Issue 2, 2013, Pages 297-311

  Reischig, Péter ^a,b,c   King, Andrew ^c   Nervo, Laura ^c,d   Viganó, Nicola ^b,c   Guilhem, Yoann ^b,c   Palenstijn, Willem Jan ^e   Batenburg, K Joost ^e,f   Preuss, Michael ^d   Ludwig, Wolfgang ^b,c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITÉ DE LYON   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d UNIVERSITY OF MANCHESTER   (United Kingdom)

^e UNIVERSITY OF ANTWERP   (Belgium)

^f CWI   (Netherlands)

Author keywords

diffraction contrast tomography; Diffraction imaging; Grain mapping; Nondestructive testing; Polycrystalline microstructure; Synchrotron radiation; X ray diffraction; X ray imaging

Indexed keywords

COMMERCIALLY PURE TITANIUMS; DIFFRACTION CONTRAST; DIFFRACTION IMAGING; ELASTIC STRAIN TENSOR; HIGH SPATIAL RESOLUTION; POLYCRYSTALLINE MICROSTRUCTURE; SIMULTANEOUS ITERATIVE RECONSTRUCTION TECHNIQUES; XRAY IMAGING;

COMPOSITE MATERIALS; ITERATIVE METHODS; MAPPING; NEMATIC LIQUID CRYSTALS; NONDESTRUCTIVE EXAMINATION; POLYCRYSTALLINE MATERIALS; SYNCHROTRON RADIATION; THREE DIMENSIONAL; TITANIUM OXIDES; TOMOGRAPHY; X RAY DIFFRACTION;

GRAIN REFINEMENT;

EID: 84875204419     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889813002604     Document Type: Article

References (42)

1. Alpers, A., Poulsen, H. F., Knudsen, E. & Herman, G. T. (2006). J. Appl. Cryst. 39, 582-588.
2. Aydiner, C. C., Bernier, J. V., Clausen, B., Lienert, U., Tomé, C. N. & Brown, D. W. (2009). Phys. Rev. B, 80, 024113.
3. Batenburg, K. J., Sijbers, J., Poulsen, H. F. & Knudsen, E. (2010). J. Appl. Cryst. 43, 1464-1473.
4. Bernier, J. V., Barton, N. R., Lienert, U. & Miller, M. P. (2011). J. Strain Anal. Eng. Des. 46, 527-547.
5. Cloetens, P., Pateyron-Salomè, M., Buffiè re, J. Y., Peix, G., Baruchel, J., Peyrin, F. & Schlenker, M. (1997). J. Appl. Phys. 81, 5878-5886.
6. Edmiston, J. K., Barton, N. R., Bernier, J. V., Johnson, G. C. & Steigmann, D. J. (2011). J. Appl. Cryst. 44, 299-312.
7. Fu, X., Knudsen, E., Poulsen, H. F., Herman, G. T., Carvalho, B. M. & Liao, H. Y. (2006). Opt. Eng. 45, 116501.
8. Herbig, M., King, A., Reischig, P., Proudhon, H., Lauridsen, E. M., Marrow, J., Buffiè re, J. & Ludwig, W. (2011). Acta Mater. 59, 590-601.
9. Johnson, G., King, A., Honnicke, M. G., Marrow, J. & Ludwig, W. (2008). J. Appl. Cryst. 41, 310-318.
10. Kak, A. & Slaney, M. (1998). Principles of Computerized Imaging. New York: IEEE Press.
11. King, A., Johnson, G., Engelberg, D., Ludwig, W. & Marrow, J. (2008). Science, 321, 382-385.
12. King, A., Ludwig, W., Herbig, M., Buffière, J., Khan, A., Stevens, N. & Marrow, T. (2011). Acta Mater. 59, 6761-6771.
13. King, A., Reischig, P., Martin, S., Fonseca, J., Preuss, M. & Ludwig, W. (2010). Proceedings of the 31st Risø International Symposium of Materials Science, pp. 43-57. Roskilde: DTU Press.
14. Labiche, J., Mathon, O., Pascarelli, S., Newton, M. A., Ferre, G. G., Curfs, C., Vaughan, G., Homs, A. & Carreiras, D. F. (2007). Rev. Sci. Instrum. 78, 091301.
15. Larson, B. C., Yang, W., Ice, G. E., Budai, J. D. & Tischler, J. Z. (2002). Nature, 415, 887-890.
16. Lauridsen, E. M., Schmidt, S., Suter, R. M. & Poulsen, H. F. (2001). J. Appl. Cryst. 34, 744-750.
17. Ludwig, W., King, A., Reischig, P., Herbig, M., Lauridsen, E., Schmidt, S., Proudhon, H., Forest, S., Cloetens, P., Rolland du Roscoat, S., Buffiè re, J., Marrow, T. & Poulsen, H. (2009). J. Mater. Sci. Eng. A, 524, 69-76.
18. Ludwig, W., Reischig, P., King, A., Herbig, M., Lauridsen, E. M., Marrow, T. J. & Buffière, J. Y. (2009). Rev. Sci. Instrum. 80, 033905.
19. Ludwig, W., Reischig, P., King, A., Herbig, M., Proudhon, H., Rutishauser, S. & David, C. (2010). Proceedings of the 31st Risø International Symposium on Materials Science, pp. 317-328. Roskilde: DTU Press.
20. Ludwig, W., Schmidt, S., Lauridsen, E. M. & Poulsen, H. F. (2008). J. Appl. Cryst. 41, 302-309.
21. Lyckegaard, A., Alpers, A., Ludwig, W., Fonda, R. W., Margulies, L., Götz, A., Sørensen, H. O., Dey, S. R., Poulsen, H. F. & Lauridsen, E. M. (2010). Proceedings of the 31st Risø International Symposium on Materials Science, pp. 329-366. Roskilde: DTU Press.
22. Martin, T. & Koch, A. (2006). J. Synchrotron Rad. 13, 180-194.
23. Moscicki, M., Kenesei, P., Wright, J., Pinto, H., Lippmann, T., Borbély, A. & Pyzalla, A. (2009). Mater. Sci. Eng. A, 524, 64-68.
24. Oddershede, J., Schmidt, S., Poulsen, H. F., Sørensen, H. O., Wright, J. & Reimers, W. (2010). J. Appl. Cryst. 43, 539-549.
25. Olsen, U., Schmidt, S., Poulsen, H., Linnros, J., Yun, S., Di Michiel, M. & Martin, T. (2009). Nucl. Instrum. Methods Phys. Res. Sect. A, 607, 141-144.
26. Paciorek, W. A., Meyer, M. & Chapuis, G. (1999). Acta Cryst. A55, 543-557.
27. Paganin, D., Mayo, S. C., Gureyev, T. E., Miller, P. R. & Wilkins, S. W. (2002). J. Microsc. 206, 33-40.
28. Palenstijn, W. J., Batenburg, K. J. & Sijbers, J. (2011). J. Struct. Biol. 176, 250-253.
29. Palenstijn, W. J., van Aarle, W., Batenburg, K. J. & Sijbers, J. (2012). ASTRA. Vision Lab, University of Antwerp, Wilrijk, Belgium, http://visielab.ua.ac.be/software.
30. Poulsen, H. F. (2004). Three-Dimensional X-ray Diffraction Microscopy. Mapping Polycrystals and Their Dynamics. Berlin: Springer.
31. Poulsen, H. F. (2012). J. Appl. Cryst. 45, 1084-1097.
32. Rack, A., Garcia-Moreno, F., Schmitt, C., Betz, O., Cecilia, A., Ershov, A., Rack, T., Banhart, J. & Zabler, S. (2010). J. X-ray Sci. Technol. 18, 429-441.
33. Reischig, P. (2008). MSc thesis, Delft University of Technology, The Netherlands.
34. Richard, A., Palancher, H., Castelier, É., Micha, J.-S., Gamaleri, M., Carlot, G., Rouquette, H., Goudeau, P., Martin, G., Rieutord, F., Piron, J. P. & Garcia, P. (2012). J. Appl. Cryst. 45, 826-833.
35. Rolland du Roscoat, S. R., King, A., Philip, A., Reischig, P., Ludwig, W., Flin, F. & Meyssonnier, J. (2011). Adv. Eng. Mater. 13, 128-135.
36. Schmidt, S., Olsen, U., Poulsen, H., Sørensen, H., Lauridsen, E., Margulies, L., Maurice, C. & Juul Jensen, D. (2008). Scr. Mater. 59, 491-494.
37. Sharma, H., Huizenga, R. M. & Offerman, S. E. (2012a). J. Appl. Cryst. 45, 693-704.
38. Sharma, H., Huizenga, R. M. & Offerman, S. E. (2012b). J. Appl. Cryst. 45, 705-718.
39. Snigirev, A., Snigireva, I., Vaughan, G., Wright, J., Rossat, M., Bytchkov, A. & Curfs, C. (2009). J. Phys. Conf. Ser. 186, 012073.
40. Suter, R. M., Hennessy, D., Xiao, C. & Lienert, U. (2006). Rev. Sci. Instrum. 77, 123905.
41. Syha, M., Rheinheimer, W., Bäurer, M., Lauridsen, E., Ludwig, W., Weygand, D. & Gumbsch, P. (2012). J. Scr. Mater. 66, 1-4.
42. Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Valek, B., Bravman, J. C., Spolenak, R., Brown, W. L., Marieb, T., Fujimoto, H., Batterman, B. W. & Patel, J. R. (2002). Appl. Phys. Lett. 80, 3724-3727.