A fast methodology to determine the characteristics of thousands of grains using three-dimensional X-ray diffraction. I. Overlapping diffraction peaks and parameters of the experimental setup

Journal of Applied Crystallography

Volumn 45, Issue 4, 2012, Pages 693-704

  Sharma, Hemant ^a   Huizenga, Richard M ^a   Offerman, S Erik ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

diffraction; experimental parameters; microscopy; peak fitting; peak overlap; synchrotron radiation; three dimensional X ray diffraction

Indexed keywords

CALIBRATION SAMPLES; CENTRE OF MASS; CRYSTALLOGRAPHIC ORIENTATIONS; DIFFRACTION DATA; DIFFRACTION IMAGES; DIFFRACTION PEAKS; EXPERIMENTAL PARAMETERS; EXPERIMENTAL SETUP; FAR-FIELD; GLOBAL PARAMETERS; GRAIN CHARACTERISTICS; INTEGRATED INTENSITIES; OVERLAPPING PEAKS; PEAK FITTING; PEAK OVERLAP; PRE-PROCESSING; SHAPE FUNCTIONS; STRAIN STATE; SUBSEQUENT DATA ANALYSIS; THREE-DIMENSIONAL MICROSTRUCTURES; WATER-SHED ALGORITHM;

ALGORITHMS; DIFFRACTION; EXPERIMENTS; MICROSCOPIC EXAMINATION; POLYCRYSTALLINE MATERIALS; SYNCHROTRON RADIATION; THREE DIMENSIONAL; X RAY DIFFRACTION;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 84864272477     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812025563     Document Type: Article

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