A discrete tomography algorithm for improving the quality of three-dimensional X-ray diffraction grain maps

Journal of Applied Crystallography

Volumn 39, Issue 4, 2006, Pages 582-588

  Alpers, A ^a   Poulsen, H F ^b   Knudsen, E ^b   Herman, G T ^a  

^a City University of New York   (United States)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746406396     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S002188980601939X     Document Type: Article

References (18)

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