New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging

Materials Science and Engineering: A

Volumn 524, Issue 1-2, 2009, Pages 69-76

  Ludwig, W ^a,b   King, A ^b,c   Reischig, P ^b   Herbig, M ^a   Lauridsen, E M ^d   Schmidt, S ^d   Proudhon, H ^e   Forest, S ^e   Cloetens, P ^b   Roscoat, S Rolland du ^b   Buffiere J Y ^a   Marrow, T J ^c   Poulsen, H F ^d  

^a UNIVERSITÉ DE LYON   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

^d TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^e CENTRE DES MATÉRIAUX   (France)

Author keywords

3D grain mapping; 3DXRD; Diffraction contrast tomography; Holotomography; Polycrystals; Topotomography

Indexed keywords

CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IMAGE RECONSTRUCTION; POLYCRYSTALLINE MATERIALS; TOMOGRAPHY; X RAY ANALYSIS; X RAY DIFFRACTION;

3D GRAIN MAPPING; 3D GRAIN SHAPE; 3DXRD; DIFFRACTION CONTRAST; DIFFRACTION CONTRAST TOMOGRAPHY; HOLOTOMOGRAPHY; MATERIAL SCIENCE; MONO-PHASES; TOPOTOMOGRAPHY; X- RAY DIFFRACTIONS;

MAPPING;

EID: 69249154168     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2009.04.009     Document Type: Article

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