메뉴 건너뛰기




Volumn 46, Issue 2, 2013, Pages 466-475

Comprehensive synchrotron grazing-incidence X-ray scattering analysis of nanostructures in porous polymethylsilsesquioxane dielectric thin films

Author keywords

cross scattering terms; GIXS formulae; grazing incidence X ray scattering (GIXS); independent scattering terms; nanomaterials; nanoporous dielectric thin films; reflection effects; refraction effects

Indexed keywords

CROSS-SCATTERING TERMS; GIXS FORMULAE; GRAZING-INCIDENCE X-RAY SCATTERING; INDEPENDENT SCATTERING; NANOPOROUS DIELECTRICS; REFLECTION EFFECTS; REFRACTION EFFECTS;

EID: 84875175725     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812050923     Document Type: Article
Times cited : (19)

References (60)
  • 28
    • 4043102553 scopus 로고    scopus 로고
    • Oh, W. & Ree, M. (2004). Langmuir, 20, 6932-6939.
    • (2004) Langmuir , vol.20 , pp. 6932-6939
    • Oh, W.1    Ree, M.2
  • 36
    • 26144449160 scopus 로고
    • Parratt, L. (1954). Phys. Rev. 95, 359-369.
    • (1954) Phys. Rev , vol.95 , pp. 359-369
    • Parratt, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.