|
Volumn 7, Issue 21, 2011, Pages 10424-10428
|
Structural characterization of the Fddd phase in a diblock copolymer thin film by electron microtomography
|
Author keywords
[No Author keywords available]
|
Indexed keywords
3-DIMENSIONAL;
DIBLOCK COPOLYMER;
DIBLOCK COPOLYMER THIN FILMS;
FILM PLANES;
FREE SURFACES;
MICRO-TOMOGRAPHY;
NETWORK STRUCTURES;
PERFORATED LAYERS;
REAL-SPACE;
SINGLE NETWORKS;
STRUCTURAL CHARACTERIZATION;
TRANSMISSION ELECTRON MICROTOMOGRAPHY;
WETTING LAYER;
BLOCK COPOLYMERS;
COPOLYMERIZATION;
POLYSTYRENES;
SILICON WAFERS;
THICK FILMS;
THIN FILMS;
SEMICONDUCTING SILICON COMPOUNDS;
|
EID: 80054976598
PISSN: 1744683X
EISSN: 17446848
Source Type: Journal
DOI: 10.1039/c1sm06236k Document Type: Article |
Times cited : (21)
|
References (51)
|