Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors

Applied Physics Letters

Volumn 102, Issue 8, 2013, Pages

  Jeong, Chan Yong ^a   Sohn, Joonsung ^a   Song, Sang Hun ^a   Cho, In Tak ^b   Lee, Jong Ho ^b   Cho, Eou Sik ^c   Kwon, Hyuck In ^a  

^a Chung Ang University   (South Korea)

^b Seoul National University   (South Korea)

^c Gachon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSPORT MECHANISMS; EXPERIMENTAL DATUM; MEYER-NELDEL RULES; MULTIPLE TRAPPING; SEMICONDUCTOR INTERFACES; SUBGAP DENSITY OF STATE (DOS); TEMPERATURE DEPENDENCE; THIN-FILM TRANSISTOR (TFTS);

GRAIN BOUNDARIES; THIN FILM TRANSISTORS;

INTERFACE STATES;

EID: 84874891178     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4794061     Document Type: Article

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