메뉴 건너뛰기




Volumn 113, Issue 7, 2013, Pages

Epitaxial PbxZr1-xTiO3 on GaN

Author keywords

[No Author keywords available]

Indexed keywords

BAND OFFSETS; DEPOSITION TEMPERATURES; DIELECTRIC RESPONSE; ELECTRICAL ANALYSIS; ELECTRICAL CHARACTERIZATION; EPITAXIAL PZT; EX SITU; FERROELECTRIC SWITCHING; GROWTH PROCESS; INTER-DIGITAL CAPACITORS; MGO; PIEZORESPONSE FORCE MICROSCOPY; PZT; SYNTHESIS AND CHARACTERIZATIONS; TIO;

EID: 84874630769     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4792599     Document Type: Article
Times cited : (10)

References (20)
  • 1
    • 0042423732 scopus 로고    scopus 로고
    • Design of high electron mobility devices with composite nitride channels
    • 10.1063/1.1594272
    • M. Singh and J. Singh, " Design of high electron mobility devices with composite nitride channels.," J. Appl. Phys. 94, 2498-2506 (2003). 10.1063/1.1594272
    • (2003) J. Appl. Phys. , vol.94 , pp. 2498-2506
    • Singh, M.1    Singh, J.2
  • 2
    • 0142011549 scopus 로고    scopus 로고
    • Examination of LiNbO3/nitride heterostructures
    • 10.1016/S0038-1101(03)00189-8
    • M. Singh, Y. R. Wu, and J. Singh, " Examination of LiNbO3/nitride heterostructures.," Solid State Electron. 47, 2155-2159 (2003). 10.1016/S0038-1101(03)00189-8
    • (2003) Solid State Electron. , vol.47 , pp. 2155-2159
    • Singh, M.1    Wu, Y.R.2    Singh, J.3
  • 3
    • 0142106868 scopus 로고    scopus 로고
    • Challenges and potential payoff for crystalline oxides in wide bandgap semiconductor technology
    • 10.1016/S0038-1101(03)00187-4
    • W. A. Doolittle, G. Namkoong, A. G. Carver, and A. S. Brown, " Challenges and potential payoff for crystalline oxides in wide bandgap semiconductor technology.," Solid State Electron. 47, 2143-2147 (2003). 10.1016/S0038-1101(03)00187-4
    • (2003) Solid State Electron. , vol.47 , pp. 2143-2147
    • Doolittle, W.A.1    Namkoong, G.2    Carver, A.G.3    Brown, A.S.4
  • 5
    • 33744524160 scopus 로고    scopus 로고
    • MgO epitaxy on GaN (0002) surfaces by molecular beam epitaxy
    • 10.1063/1.2201041
    • H. S. Craft, " MgO epitaxy on GaN (0002) surfaces by molecular beam epitaxy.," Appl. Phys. Lett. 88, 212906 (2006). 10.1063/1.2201041
    • (2006) Appl. Phys. Lett. , vol.88 , pp. 212906
    • Craft, H.S.1
  • 6
    • 35348866770 scopus 로고    scopus 로고
    • Band offsets and growth mode of molecular beam epitaxy grown MgO (111) on GaN (0002) by x-ray photoelectron spectroscopy
    • 10.1063/1.2785022
    • H. S. Craft, " Band offsets and growth mode of molecular beam epitaxy grown MgO (111) on GaN (0002) by x-ray photoelectron spectroscopy.," J. Appl. Phys. 102, 074104 (2007). 10.1063/1.2785022
    • (2007) J. Appl. Phys. , vol.102 , pp. 074104
    • Craft, H.S.1
  • 8
    • 34247323474 scopus 로고    scopus 로고
    • -3 thin films on GaN/sapphire for nanoelectromechanical systems
    • 10.1007/s10971-006-0650-3
    • -3 thin films on GaN/sapphire for nanoelectromechanical systems.," J. Sol-Gel Sci. Technol. 42, 389-395 (2007). 10.1007/s10971-006-0650-3
    • (2007) J. Sol-Gel Sci. Technol. , vol.42 , pp. 389-395
    • Cao, W.1    Dey, S.K.2
  • 9
    • 33745985737 scopus 로고    scopus 로고
    • 3 thin films on GaN/sapphire by metalorganic chemical vapor deposition
    • 10.1557/jmr.2006.0184
    • -3 thin films on GaN/sapphire by metalorganic chemical vapor deposition.," J. Mater. Res. 21, 1526-1531 (2006). 10.1557/jmr.2006.0184
    • (2006) J. Mater. Res. , vol.21 , pp. 1526-1531
    • Dey, S.K.1    Cao, W.2    Bhaskar, S.3    Li, J.4
  • 10
    • 3142670469 scopus 로고    scopus 로고
    • -3/GaN heterostructures by scanning probe microscopy
    • 10.1063/1.1765740
    • -3/GaN heterostructures by scanning probe microscopy.," Appl. Phys. Lett. 84, 5153-5155 (2004). 10.1063/1.1765740
    • (2004) Appl. Phys. Lett. , vol.84 , pp. 5153-5155
    • Gruverman, A.1    Cao, W.2    Bhaskar, S.3    Dey, S.K.4
  • 11
    • 77957698332 scopus 로고    scopus 로고
    • Study of the integrated growth of dielectric films on GaN semiconductor subsrates
    • 10.1109/TUFFC.2010.1677
    • Y. Li, J. Zhu, and W. B. Luo, " Study of the integrated growth of dielectric films on GaN semiconductor subsrates.," IEEE Trans. Ultrason. Ferroelectr. Freq. Control 57, 2192-2197 (2010). 10.1109/TUFFC.2010.1677
    • (2010) IEEE Trans. Ultrason. Ferroelectr. Freq. Control , vol.57 , pp. 2192-2197
    • Li, Y.1    Zhu, J.2    Luo, W.B.3
  • 12
    • 35649025759 scopus 로고    scopus 로고
    • 3 grown on (0001) GaN using a double PbTiO3/PbO bridge layer
    • 10.1063/1.2805220
    • -3 grown on (0001) GaN using a double PbTiO3/PbO bridge layer.," Appl. Phys. Lett. 91, 182908 (2007). 10.1063/1.2805220
    • (2007) Appl. Phys. Lett. , vol.91 , pp. 182908
    • Xiao, B.1
  • 13
    • 30344467838 scopus 로고    scopus 로고
    • Growth of Ga- and N-polar gallium nitride layers by metalorganic vapor phase epitaxy on sapphire wafers
    • 10.1016/j.jcrysgro.2005.10.080
    • R. Collazo, S. Mita, A. Aleksov, R. Schlesser, and Z. Sitar, " Growth of Ga- and N-polar gallium nitride layers by metalorganic vapor phase epitaxy on sapphire wafers.," J. Cryst. Growth 287, 586-590 (2006). 10.1016/j.jcrysgro.2005.10.080
    • (2006) J. Cryst. Growth , vol.287 , pp. 586-590
    • Collazo, R.1    Mita, S.2    Aleksov, A.3    Schlesser, R.4    Sitar, Z.5
  • 14
    • 0037591709 scopus 로고    scopus 로고
    • Investigation of the crystallisation behaviour of lead titanate (PT), lead zirconate (PZ) and lead zirconate titanate (PZT) by EXAFS-spectroscopy and X-ray diffraction
    • 10.1023/A:1023706802758
    • M. P. Feth, A. Weber, R. Merkle, U. Reinohl, and H. Bertagnolli, " Investigation of the crystallisation behaviour of lead titanate (PT), lead zirconate (PZ) and lead zirconate titanate (PZT) by EXAFS-spectroscopy and X-ray diffraction.," J. Sol-Gel Sci. Technol. 27, 193-204 (2003). 10.1023/A:1023706802758
    • (2003) J. Sol-Gel Sci. Technol. , vol.27 , pp. 193-204
    • Feth, M.P.1    Weber, A.2    Merkle, R.3    Reinohl, U.4    Bertagnolli, H.5
  • 15
    • 0012090678 scopus 로고
    • Epitaxial-growth of ferroelectric Plzt [(Pb,La)(Zr,Ti)O3] thin-films
    • 10.1016/0022-0248(78)90468-2
    • M. Ishida, S. Tsuji, K. Kimura, H. Matsunami, and T. Tanaka, " Epitaxial-growth of ferroelectric Plzt [(Pb,La)(Zr,Ti)O3] thin-films.," J. Cryst. Growth 45, 393-398 (1978). 10.1016/0022-0248(78)90468-2
    • (1978) J. Cryst. Growth , vol.45 , pp. 393-398
    • Ishida, M.1    Tsuji, S.2    Kimura, K.3    Matsunami, H.4    Tanaka, T.5
  • 16
    • 34347355424 scopus 로고    scopus 로고
    • Nonvolatile gate effect in the PZT/AlGaN/GaN heterostructure
    • 10.1016/j.jeurceramsoc.2007.02.150
    • I. Stolichnov, L. Malin, P. Muralt, and N. Setter, " Nonvolatile gate effect in the PZT/AlGaN/GaN heterostructure.," J. Eur. Ceram. Soc. 27, 4307-4311 (2007). 10.1016/j.jeurceramsoc.2007.02.150
    • (2007) J. Eur. Ceram. Soc. , vol.27 , pp. 4307-4311
    • Stolichnov, I.1    Malin, L.2    Muralt, P.3    Setter, N.4
  • 17
    • 0032092953 scopus 로고    scopus 로고
    • Fabrication of Pb(Zr,Ti)O-3/MgO/CaN/GaAs structure for optoelectronic device applications
    • 10.1016/S0022-0248(98)00241-3.
    • A. Masuda, " Fabrication of Pb(Zr,Ti)O-3/MgO/CaN/GaAs structure for optoelectronic device applications.," J. Cryst. Growth 189, 227-230 (1998) 10.1016/S0022-0248(98)00241-3.
    • (1998) J. Cryst. Growth , vol.189 , pp. 227-230
    • Masuda, A.1
  • 18
    • 0001275470 scopus 로고    scopus 로고
    • Studies of metal-ferroelectric-GaN structures
    • 10.1063/1.125032
    • W. P. Li, " Studies of metal-ferroelectric-GaN structures.," Appl. Phys. Lett. 75, 2416-2417 (1999). 10.1063/1.125032
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 2416-2417
    • Li, W.P.1
  • 19
    • 60649088236 scopus 로고    scopus 로고
    • Epitaxial Ba(0.5)Sr(0.5)TiO(3)-GaN heterostructures with abrupt interfaces
    • 10.1016/j.jcrysgro.2008.11.085
    • M. D. Losego, " Epitaxial Ba(0.5)Sr(0.5)TiO(3)-GaN heterostructures with abrupt interfaces.," J. Cryst. Growth 311, 1106-1109 (2009). 10.1016/j.jcrysgro.2008.11.085
    • (2009) J. Cryst. Growth , vol.311 , pp. 1106-1109
    • Losego, M.D.1
  • 20
    • 0031619828 scopus 로고    scopus 로고
    • Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy
    • 10.1146/annurev.matsci.28.1.101
    • A. Gruverman, O. Auciello, and H. Tokumoto, " Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy.," Annu. Rev. Mater. Sci. 28, 101-123 (1998). 10.1146/annurev.matsci.28.1.101
    • (1998) Annu. Rev. Mater. Sci. , vol.28 , pp. 101-123
    • Gruverman, A.1    Auciello, O.2    Tokumoto, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.