Correlations between the morphology and emission properties of trench defects in InGaN/GaN quantum wells

Journal of Applied Physics

Volumn 113, Issue 7, 2013, Pages

  Massabuau, F C P ^a   Trinh Xuan, L ^a   Lodie D ^a   Thrush, E J ^a   Zhu, D ^a   Oehler, F ^a   Zhu, T ^a   Kappers, M J ^a   Humphreys, C J ^a   Oliver, R A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; BASAL PLANE STACKING FAULTS; BLUE-EMITTING; EMISSION PROPERTIES; INGAN/GAN; INGAN/GAN QUANTUM WELL; INTENSITY RATIO; NON-RADIATIVE RECOMBINATIONS; RED SHIFT; RED-SHIFTED; RED-SHIFTED EMISSION; SAMPLE SURFACE; STACKING MISMATCH BOUNDARIES; STRONG CORRELATION; SUB-SURFACES; SURROUNDING MATERIALS; SURROUNDING REGIONS;

ATOMIC FORCE MICROSCOPY; DEFECTS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 84874609731     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4792505     Document Type: Article

References (22)

1. I. Vurgaftman and J. R. Meyer, J. Appl. Phys. 94, 3675 (2003). 10.1063/1.1600519
2. S. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 1687 (1994). 10.1063/1.111832
3. S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto, Jpn. J. Appl. Phys. Part 2 35, L74 (1996). 10.1143/JJAP.35.L74
4. C. Sun, M. Z. Anwar, Q. Chen, J. Yang, M. A. Khan, M. Shur, A. Bykhovski, Z. Liliental-Weber, C. Kisielowski, M. Smith, J. Lin, and H. Xiang, Appl. Phys. Lett. 70, 2978 (1997). 10.1063/1.118762
5. D. I. Florescu, S. M. Ting, J. C. Ramer, D. S. Lee, V. N. Merai, A. Parkeh, D. Lu, E. A. Armour, and L. Chernyak, Appl. Phys. Lett. 83, 33 (2003). 10.1063/1.1588370
6. S. M. Ting, J. C. Ramer, D. I. Florescu, V. N. Merai, B. E. Albert, A. Parekh, D. S. Lee, D. Lu, D. V. Christini, L. Liu, and E. A. Armour, J. Appl. Phys. 94, 1461 (2003). 10.1063/1.1586972
7. J. Bruckbauer, P. R. Edwards, T. Wang, and R. W. Martin, Appl. Phys. Lett. 98, 141908 (2011). 10.1063/1.3575573
8. M. S. Kumar, J. Y. Park, Y. S. Lee, S. J. Chung, C.-H. Hong, and E.-K. Suh, J. Phys. D: Appl. Phys. 40, 5050 (2007). 10.1088/0022-3727/40/17/007
9. M. S. Kumar, Y. S. Lee, J. Y. Park, S. J. Chung, C.-H. Hong, and E.-K. Suh, Mater. Chem. Phys. 113, 192 (2009). 10.1016/j.matchemphys.2008.07.068
10. F. C.-P. Massabuau, S.-L. Sahonta, L. Trinh-Xuan, S. Rhode, T. J. Puchtler, M. J. Kappers, C. J. Humphreys, and R. A. Oliver, Appl. Phys. Lett. 101, 212107 (2012). 10.1063/1.4768291
11. M. E. Vickers, M. J. Kappers, T. M. Smeeton, E. J. Thrush, J. S. Barnard, and C. J. Humphreys, J. Appl. Phys. 94, 1565 (2003). 10.1063/1.1587251
12. S.-L. Sahonta, M. J. Kappers, D. Zhu, T. J. Puchtler, T. Zhu, S. E. Bennett, C. J. Humphreys, and R. A. Oliver, Phys. Status Solidi A 210, 195 (2013). 10.1002/pssa.201200408
13. T. L. Song, J. Appl. Phys. 98, 084906 (2005). 10.1063/1.2108148
14. M. Müller, G. D. W. Smith, B. Gault, and C. R. M. Grovenor, Acta Mater. 60, 4277 (2012). 10.1016/j.actamat.2012.04.030
15. S. Pereira, M. R. Correia, E. Pereira, K. P. O'Donnell, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson, and C. J. Deatcher, Appl. Phys. Lett. 80, 3913 (2002). 10.1063/1.1481786
16. M. E. Coltrin and C. C. Mitchell, J. Cryst. Growth 254, 35 (2003). 10.1016/S0022-0248(03)01165-5
17. H. Fang, Z. J. Yang, Y. Wang, T. Dai, L. W. Sang, L. B. Zhao, T. J. Yu, and G. Y. Zhang, J. Appl. Phys. 103, 014908 (2008). 10.1063/1.2829784
18. T. Shioda, M. Sugiyama, Y. Shimogaki, and Y. Nakano, Phys. Status Solidi A 207, 1375 (2010). 10.1002/pssa.200983606
19. P. Corfdir, J. Ristić, P. Lefebvre, T. Zhu, D. Martin, A. Dussaigne, J. D. Ganière, N. Grandjean, and B. Deveaud-Plédran, Appl. Phys. Lett. 94, 201115 (2009). 10.1063/1.3142396
20. X. Ni, Ü. Özgür, H. Morkoç, Z. Liliental-Weber, and H. O. Everitt, J. Appl. Phys. 102, 053506 (2007). 10.1063/1.2773692
21. N. Yamamoto, H. Itoh, V. Grillo, S. F. Chichibu, S. Keller, J. S. Speck, S. P. DenBaars, U. K. Mishra, S. Nakamura, and G. Salviati, J. Appl. Phys. 94, 4315 (2003). 10.1063/1.1598632
22. S. J. Rosner, E. C. Carr, M. J. Ludowise, G. Girolami, and H. I. Erikson, Appl. Phys. Lett. 70, 420 (1997). 10.1063/1.118322