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Advanced Functional Materials

Volumn 23, Issue 6, 2013, Pages 713-719

In situ study of size and temperature dependent brittle-to-ductile transition in single crystal silicon

(2) Kang, Wonmo a Saif, M Taher A a

a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN (United States)

Author keywords

electron microscopy; in situ thermomechanical test; silicon; size effect

Indexed keywords

BRITTLE-TO-DUCTILE TRANSITION; BRITTLE-TO-DUCTILE TRANSITION (BDT); BULK SILICON; COMPUTATIONAL STUDIES; CONCURRENT CONTROL; EXPERIMENTAL OBSERVATION; IN-SITU STUDY; KEY PARAMETERS; MECHANISM-BASED MODEL; MEMS STAGE; NANO SCALE; NANOMETER SCALE DEVICES; ROOM TEMPERATURE; SAMPLE SIZES; SILICON-BASED; SINGLE CRYSTAL SILICON; SIZE EFFECTS; SMALL SCALE; TEMPERATURE DECREASE; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; THERMO-MECHANICAL; THERMOMECHANICAL PROPERTIES; UNDERLYING MECHANISM;

CONCURRENCY CONTROL; ELECTRON MICROSCOPY; EXCITONS; MECHANICAL PROPERTIES; SILICON; SILICON CARBIDE; SILICON WAFERS; SINGLE CRYSTALS;

MONOCRYSTALLINE SILICON;

EID: 84873635761 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.201201992 Document Type: Article

Times cited : (52)

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