Electron beam irradiation stiffens zinc tin oxide nanowires

Nano Letters

Volumn 11, Issue 11, 2011, Pages 4885-4889

  Zang, Jianfeng ^a   Bao, Lihong ^a   Webb, Richard A ^b   Li, Xiaodong ^a  

^a The Department of Mechanical Engineering   (United States)

^b UNIVERSITY OF SOUTH CAROLINA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC BONDS; BUCKLING TESTS; ELECTRICAL CONDUCTIVITY; ELECTRON BEAM IRRADIATION; IN-SITU; NANO MANIPULATOR; SCANNING ELECTRON MICROSCOPE; YOUNG'S MODULUS; ZINC TIN OXIDE;

ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; IRRADIATION; NANOWIRES; SCANNING ELECTRON MICROSCOPY; TIN; TIN OXIDES; ZINC;

ELECTRIC WIRE;

NANOTUBE; TIN DERIVATIVE; TIN DIOXIDE; ZINC OXIDE;

ARTICLE; CHEMISTRY; CONFORMATION; ELECTRON; HARDNESS; MATERIALS TESTING; RADIATION EXPOSURE; ULTRASTRUCTURE; YOUNG MODULUS;

ELASTIC MODULUS; ELECTRONS; HARDNESS; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOTUBES; TIN COMPOUNDS; ZINC OXIDE;

EID: 80755189402     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl2027519     Document Type: Article

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