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Volumn 87, Issue 4, 2013, Pages

Electron spin resonance observation of charge carrier concentration in organic field-effect transistors during device operation

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EID: 84872955046     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.045309     Document Type: Article
Times cited : (28)

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