Fundamental aspects of electrospray droplet impact/SIMS

Journal of Mass Spectrometry

Volumn 41, Issue 7, 2006, Pages 894-902

  Hiraoka, Kenzo ^a   Mori, Kunihiko ^a   Asakawa, Daiki ^a  

^a UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

Electrospray droplet impact; Massive cluster impact; SIMS

Indexed keywords

ACETIC ACID; IONIZATION; MONOLAYERS; ORIFICES; SODIUM CHLORIDE; STAINLESS STEEL; VACUUM TECHNOLOGY;

ELECTROSPRAY DROPLET IMPACT; MASSIVE CLUSTER IMPACT; PHONON EXCITATION; QUADRUPOLE ION GUIDE;

SECONDARY ION MASS SPECTROMETRY;

ACETIC ACID; CYTOCHROME C; GRAMICIDIN S; ICE; LYSOZYME; SODIUM CHLORIDE; STAINLESS STEEL; VOLATILE AGENT;

AQUEOUS SOLUTION; ARTICLE; CONTAMINATION; DESORPTION; ELECTRIC POTENTIAL; ELECTROSPRAY; FRAGMENTATION REACTION; INTERMETHOD COMPARISON; IONIZATION; MOLECULAR WEIGHT; PRIORITY JOURNAL; SENSITIVITY ANALYSIS; TIME OF FLIGHT MASS SPECTROMETRY; VACUUM;

EID: 33746282175     PISSN: 10765174     EISSN: 10969888     Source Type: Journal    
DOI: 10.1002/jms.1048     Document Type: Article

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