Planning of accelerated life tests with dependent failure modes based on a gamma frailty model

Technometrics

Volumn 54, Issue 4, 2012, Pages 398-409

  Liu, Xiao ^a  

^a IBM Singapore Pte Ltd   (Singapore)

Author keywords

Competing risks; Design of experiments

Indexed keywords

ACCELERATED LIFE TESTS; APPROXIMATE VARIANCE; COMPETING RISKS; DEPENDENT FAILURE; GAMMA FRAILTY MODELS; GATE OXIDE BREAKDOWN; LIMITING CASE; MAXIMUM LIKELIHOOD ESTIMATOR; MISSPECIFICATION; MODEL PARAMETERS; PRODUCT COMPLEXITY; PRODUCT RELIABILITY; STATISTICAL DEPENDENCE; STATISTICAL MODELING; TEST PLAN;

DESIGN OF EXPERIMENTS; FIELD EFFECT TRANSISTORS; MAXIMUM LIKELIHOOD ESTIMATION; TESTING;

FAILURE MODES;

EID: 84872311668     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.2012.707579     Document Type: Article

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