Bayesian methods for planning accelerated life tests

Technometrics

Volumn 48, Issue 1, 2006, Pages 49-60

  Zhang, Yao ^a   Meeker, William Q ^b  

^a PFIZER INC   (United States)

^b Iowa State University   (United States)

Author keywords

C optimality; Censored data; Equivalence theorem; Log location scale family; Optimal design; Preposterior; Reliability

Indexed keywords

C-OPTIMALITY; CENSORED DATA; EQUIVALENCE THEOREM; LOG-LOCATION-SCALE FAMILY; OPTIMAL DESIGN; PREPOSTERIOR;

APPROXIMATION THEORY; MATHEMATICAL MODELS; OPTIMIZATION; PARAMETER ESTIMATION; THEOREM PROVING; WEIBULL DISTRIBUTION;

DATA REDUCTION;

EID: 33344461125     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000373     Document Type: Article

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