Using accelerated life tests results to predict product field reliability

Technometrics

Volumn 51, Issue 2, 2009, Pages 146-161

  Meeker, William Q ^a   Escobar, Luis A ^b   Hong, Yili ^a  

^a Department of Statistics Center for Statistics and Applications in Forensic Evidence Iowa State University 2438 Osborn Dr Ames   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

Bivariate lognormal distribution; Censored data; Competing risks; Fatigue; Maximum likelihood; Multiple failure modes; Reliability; Warranty

Indexed keywords

BIVARIATE LOGNORMAL DISTRIBUTION; CENSORED DATA; COMPETING RISKS; FATIGUE; MULTIPLE FAILURE MODES; WARRANTY;

BLOCK CODES; MAXIMUM LIKELIHOOD; RISK PERCEPTION; SYSTEMS ANALYSIS; TESTING;

FAILURE ANALYSIS;

EID: 65349168842     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1198/TECH.2009.0016     Document Type: Article

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