-
1
-
-
0026399852
-
Optimum simple step-stress accelerated life-tests with competing causes of failure
-
Bai D.S., and Chun Y.R. Optimum simple step-stress accelerated life-tests with competing causes of failure. IEEE Transactions on Reliability 40 (1991) 622-627
-
(1991)
IEEE Transactions on Reliability
, vol.40
, pp. 622-627
-
-
Bai, D.S.1
Chun, Y.R.2
-
5
-
-
27844500564
-
Model selection for the competing-risks model with and without masking
-
Craiu R.V., and Lee T.C.M. Model selection for the competing-risks model with and without masking. Technometrics 47 (2005) 457-467
-
(2005)
Technometrics
, vol.47
, pp. 457-467
-
-
Craiu, R.V.1
Lee, T.C.M.2
-
8
-
-
0003729237
-
-
Wiley, New York
-
Johnson N.L., Kotz S., and Balakrishnan N. Continuous Multivariate Distributions, Models and Applications, vol. 1 (2000), Wiley, New York
-
(2000)
Continuous Multivariate Distributions, Models and Applications, vol. 1
-
-
Johnson, N.L.1
Kotz, S.2
Balakrishnan, N.3
-
11
-
-
0021427118
-
A comparison of accelerated life test plans for Weibull and lognormal distributions and Type I censoring
-
Meeker W.Q. A comparison of accelerated life test plans for Weibull and lognormal distributions and Type I censoring. Technometrics 26 (1984) 157-171
-
(1984)
Technometrics
, vol.26
, pp. 157-171
-
-
Meeker, W.Q.1
-
13
-
-
71649086120
-
-
Meeker, W.Q., Hahn, J.G., 1985. How to Plan an Accelerated Life Test-Some Practical Guidelines-ASQC Basic References in Quality Control: Statistical Techniques, 10. Available from the American Society for Quality Control, 310 W. Wisconsin Ave., Milwaukee, WI, 1985.
-
Meeker, W.Q., Hahn, J.G., 1985. How to Plan an Accelerated Life Test-Some Practical Guidelines-ASQC Basic References in Quality Control: Statistical Techniques, vol. 10. Available from the American Society for Quality Control, 310 W. Wisconsin Ave., Milwaukee, WI, 1985.
-
-
-
-
15
-
-
22444440839
-
A bibliography of accelerated test plans
-
Nelson W. A bibliography of accelerated test plans. IEEE Transactions in Reliability 54 (2005) 194-197
-
(2005)
IEEE Transactions in Reliability
, vol.54
, pp. 194-197
-
-
Nelson, W.1
-
16
-
-
85008060887
-
A bibliography of accelerated test plans part II-reference
-
Nelson W. A bibliography of accelerated test plans part II-reference. IEEE Transactions in Reliability 54 (2005) 370-373
-
(2005)
IEEE Transactions in Reliability
, vol.54
, pp. 370-373
-
-
Nelson, W.1
-
17
-
-
0016919169
-
Theory for optimum censored accelerated life tests for normal and lognormal life distributions
-
Nelson W., and Kielpinski T. Theory for optimum censored accelerated life tests for normal and lognormal life distributions. Technometrics 18 (1976) 105-114
-
(1976)
Technometrics
, vol.18
, pp. 105-114
-
-
Nelson, W.1
Kielpinski, T.2
-
18
-
-
0017972683
-
Theory for optimum censored accelerated life tests for Weibull and extreme value distributions
-
Nelson W., and Meeker W.Q. Theory for optimum censored accelerated life tests for Weibull and extreme value distributions. Technometrics 20 (1978) 171-177
-
(1978)
Technometrics
, vol.20
, pp. 171-177
-
-
Nelson, W.1
Meeker, W.Q.2
-
19
-
-
34047189210
-
Accelerated life test planning with independent Weibull competing risks with known shape parameter
-
Pascual F.G. Accelerated life test planning with independent Weibull competing risks with known shape parameter. IEEE Transactions on Reliability 56 (2007) 85-93
-
(2007)
IEEE Transactions on Reliability
, vol.56
, pp. 85-93
-
-
Pascual, F.G.1
-
20
-
-
51449101242
-
Errata to accelerated life test planning with independent Weibull competing risks with known shape parameter
-
Pascual F.G. Errata to accelerated life test planning with independent Weibull competing risks with known shape parameter. IEEE Transactions on Reliability 57 (2008) 531-532
-
(2008)
IEEE Transactions on Reliability
, vol.57
, pp. 531-532
-
-
Pascual, F.G.1
-
21
-
-
51449090740
-
Accelerated life test planning with independent Weibull competing risks
-
Pascual F.G. Accelerated life test planning with independent Weibull competing risks. IEEE Transactions on Reliability 57 (2008) 435-444
-
(2008)
IEEE Transactions on Reliability
, vol.57
, pp. 435-444
-
-
Pascual, F.G.1
-
22
-
-
0037323180
-
Model-robust test plans with applications in accelerated life testing
-
Pascual, F.G., Montepiedra, G., 2003. Model-robust test plans with applications in accelerated life testing. Technometrics 45, 47-57.
-
(2003)
Technometrics
, vol.45
, pp. 47-57
-
-
Pascual, F.G.1
Montepiedra, G.2
-
23
-
-
0003790433
-
-
Springer, New York
-
Piessens R., deDoncker-Kapenga E., Uberhuber C., and Kahaner D. QUADPACK: A Subroutine Package for Automatic Integration (1983), Springer, New York
-
(1983)
QUADPACK: A Subroutine Package for Automatic Integration
-
-
Piessens, R.1
deDoncker-Kapenga, E.2
Uberhuber, C.3
Kahaner, D.4
-
24
-
-
85041933023
-
An extension of the general equivalence theorem to nonlinear models
-
White L.V. An extension of the general equivalence theorem to nonlinear models. Biometrika 60 (1973) 345-348
-
(1973)
Biometrika
, vol.60
, pp. 345-348
-
-
White, L.V.1
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