A tool for evaluating time-varying-stress accelerated life test Plans with log-location-scale distributions

IEEE Transactions on Reliability

Volumn 59, Issue 4, 2010, Pages 620-627

  Hong, Yili ^a   Ma, Haiming ^b   Meeker, William Q ^c  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b ATandT Modeling Group   (United States)

^c Iowa State University   (United States)

Author keywords

Cumulative exposure model; large sample approximate variance; lognormal; maximum likelihood; ramp stress; step stress; Weibull

Indexed keywords

APPROXIMATE VARIANCE; CUMULATIVE EXPOSURE MODEL; LOGNORMAL; RAMP-STRESS; STEP-STRESS; WEIBULL;

COVARIANCE MATRIX; ESTIMATION; MAXIMUM LIKELIHOOD ESTIMATION; QUALITY ASSURANCE; RELIABILITY THEORY; TIME VARYING SYSTEMS;

TESTING;

EID: 78649786158     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2083252     Document Type: Article

References (16)

1. A. A. Alhadeed and S. S. Yang, "Optimum Simple Step-Stress Plan for Cumulative Exposure Model Using Log-Normal Distribution," IEEE Trans. Reliability, Vol. 50, pp. 64-68, 2005.
2. D. S. Bai, M. S. Cha, and S. W. Chung, "Optimum simple ramp-tests for the Weibull distribution and type-I censoring," IEEE Trans. Reliability, Vol. 41, pp. 407-413, 1992.
3. D. S. Bai, Y.R. Chun, and M. S. Cha, "Time-Censored Ramp Tests with Stress Bound for Weibull Life Distribution," IEEE Trans. Reliability, Vol. 46, pp. 99-107, 1997.
4. D. S. Bai and M. S. Kim, "Optimum Simple Step-Stress Accelerated Life Tests for Weibull Distribution and Type I Censoring," Naval Research Logistics, Vol. 40, pp. 193-210, 1993.
5. L. A. Escobar, W. Q. Meeker, D. L. Kugler, and L. L. Kramer, "Accelerated Destructive Degradation Tests: Data, Models, and Analysis," in Mathematical and Statistical Methods in Reliability, B. H. Lindqvist and K. A. Doksum, Eds.: World Scientific Publishing Company, 2003.
6. H. Ma and W. Q. Meeker, "Optimum Step-Stress Accelerated Life Test Plans for Log-Location-Scale Distributions," Naval Research Logistics, Vol. 55, pp. 551-562, 2008.
7. W. Q. Meeker and G. J. Hahn, How To Plan An Accelerated Life Test-Some Practical Guideline. Milwaukee, Wisconsin: American Society for Quality Control, 1985, Volume 10 in the American Society for Quality Control Basic References in Quality Control: Statistical Techniques.
8. W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data. New York: Wiley, 1998.
9. W. Q. Meeker, L. A. Escobar, and C. J. Lu, "Accelerated Degradation Tests: Modeling and Analysis," Technometrics, Vol. 40, pp. 89-99, 1998.
10. R. Miller and W. Nelson, "Optimum Simple Step-Stress Plans for Accelerated Life Testing," IEEE Trans. Reliability, Vol. 32, pp. 59-65, 1983.
11. W. N. Venables and D. M. Smith, An Introduction to R. Bristol, U.K.: Network Theory Ltd., 2004.
12. W. Nelson and T. J. Kielpinski, "Theory for Optimum Censored Accelerated Tests for Normal and Lognormal Life Distributions," Technometrics, Vol. 18, pp. 105-114, 1976.
13. W. Nelson, Accelerated Testing Statistical Models, Test Plans and Data Analysis. New York: Wiley, 1990.
14. W. Nelson, "A Bibliography of Accelerated Test Plans, Part I-Overview," IEEE Trans. Reliability, Vol. 54, pp. 194-197, 2005.
15. W. Nelson, "A Bibliography of Accelerated Test Plans, Part II-References," IEEE Trans. Reliability, Vol. 54, pp. 370-373, 2005.
16. X. K. Yin and B. Z. Sheng, "Some Aspects of Accelerated Life Testing by Stress," IEEE Trans. Reliability, Vol. 36, pp. 150-155, 1987.