Accelerated life test plans for repairable systems with multiple independent risks

IEEE Transactions on Reliability

Volumn 59, Issue 1, 2010, Pages 115-127

  Liu, Xiao ^a   Tang, Long Ching ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Accelerated life test; Bayesian optimal design; Competing risks; D optimality; Kullback Leibler distance; Power law process; Repairable systems

Indexed keywords

ACCELERATED LIFE TESTS; BAYESIAN OPTIMAL DESIGNS; COMPETING RISKS; D-OPTIMALITY; KULLBACK-LEIBLER DISTANCE; POWER LAW PROCESS; REPAIRABLE SYSTEMS;

BAYESIAN NETWORKS; DIESEL ENGINES; FAILURE ANALYSIS; FISHER INFORMATION MATRIX; OPTIMAL SYSTEMS; OPTIMIZATION;

STATISTICAL TESTS;

EID: 77949264195     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2040758     Document Type: Article

References (34)

1. W. Nelson, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis.: John Wiley & Sons, Inc., 1990.
2. W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data.: John Wiley & Sons, Inc., 1998.
3. M. Guida and M. Giorgio, "Reliability analysis of accelerated life-test data from a repairable system," IEEE Trans. Reliability, vol. 44, pp. 337-346, Jun. 1995.
4. W. Y. Yun, E. S. Kim, and J. H. Cha, "Accelerated life test data analysis for repairable systems," Communications in Statistics - Theory and Methods, vol. 35, pp. 1803-1814, 2006.
5. F. Guerin, B. Dumon, and P. Lantieri, "Accelerated life testing on repairable systems," in The Annual Reliability and Maintainability Symposium, Jan. 2004, pp. 340-345.
6. H. Pham and H. Wang, "Imperfect maintenance," European Journal of Operational Research, vol. 94, pp. 425-438, 1996.
7. B. J. Flehinger, "Product test planning for repairable systems," Technometrics, vol. 7, pp. 485-494, 1965.
8. H. Guo and R. Pan, "On determining sample size and testing duration of repairable system test," in The Annual Reliability and Maintainability Symposium, Jan. 2008.
9. H. Langseth and B. H. Lindqvist, "Competing risks for repairable systems: A data study," Journal of Statistical Planning and Inference, vol. 136, pp. 1687-1700, 2006.
10. J. P. Klein and A. P. Basu, "Weibull accelerated life tests when there are competing causes of failure," Communications in Statistics-Theory and Methods, vol. A10, pp. 2073-2100, 1981.
11. W. Zhao and E. A. Elsayed, "An accelerated life testing under competing failure modes," The Annual Reliability and Maintainability Symposium, pp. 324-329, Jan. 2004.
12. F. Pascual, "Accelerated life test planning with independent Weibull competing risks," IEEE Trans. Reliability, vol. 57, pp. 435-444, 2008.
13. W. Nelson and T. Kielpinski, "Theory for optimum censored accelerated life tests for normal and lognormal life distributions," Technometrics, vol. 18, pp. 15-114, 1976.
14. W. Nelson and W. Q. Meeker, "Theory for optimum censored accelerated life tests for Weibull and extreme value distributions," Technometrics, vol. 20, pp. 171-177, 1978.
15. K. Chaloner and K. Larntz, "Bayesian design of accelerated life testing," Journal of Statistical Planning and Inference, vol. 33, pp. 245-259, 1992.
16. Y. Zhang and W. Q. Meeker, "Bayesian methods for planning accelerated life tests," Technometrics, vol. 48, pp. 49-60, 2006.
17. N. D. Singpurwalla, Reliability and Risk: A Bayesian Perspective.: John Wiley & Sons, Ltd., 2006.
18. P. Whittle, "Some general points in the theory of optimal experimental design," Journal of the Royal Statistician Society, Series B, vol. 35, pp. 123-130, 1973.
19. S. E. Rigdon and A. P. Basu, Statistical Methods for the Reliability of Repairable Systems.: John Wiley & Sons, Inc., 2000.
20. D. R. Cox, "Regression models and life-tables (with discussion)," Journal of the Royal Statistician Society, Series B, vol. 34, pp. 187-220, 1972.
21. L. C. Tang and K. Xu, "A multiple objective framework for planning accelerated life tests," IEEE Trans. Reliability, vol. 54, pp. 58-63, 2005.
22. K. Chaloner and I. Verdinelli, "Bayesian experimental design: A review," Statistical Science, vol. 10, pp. 273-304, 1995.
23. A. Zellner, "Optimal information processing and Bayes' theorem," The American Statistician, vol. 42, pp. 278-284, 1988.
24. P. Muller and G. Parmigiani, "Numerical evaluation of information theoretic measures," in Bayesian Analysis in Statistics and Econometrics: Essays in Honor of Arnold Zellner, D. A. Berry, K. M. Chaloner, and J. F. Geweke, Eds.: Wiley, 1996, pp. 397-406.
25. J. O. Berger, Statistical Decision Theory and Bayesian Analysis.: Springer-Verlag, 1985.
26. A. C. Atkinson and A. N. Donev, Optimum Experimental Designs.: Clarendon Press, 1992.
27. D. Firth and J. P. Hinde, "On Bayesian D-optimum design criteria and the equivalence theorem in non-linear models," Journal of the Royal Statistical Society, B, vol. 59, pp. 793-797, 1997.
28. R. E. Kass and E. H. Slate, "Some diagnostics of maximum likelihood and posterior non-normality," Annals of Statistics, vol. 22, pp. 668-695, 1994.
29. K. Chaloner and K. Larntz, "Optimal Bayesian experimental design applied to logistic regression experiments," Journal of Statistical Planning and Inference, vol. 21, pp. 191-208, 1989.
30. W. Q. Meeker, G. J. Hahn, and N. Doganaksoy, "Planning reliability assessment," Quality Progress, vol. 38, pp. 90-93, 2005.
31. T. Bedford and B. H. Lindqvist, "The identifiability problem for repairable systems subject to competing risks," Advances in Applied Probability, vol. 36, pp. 774-790, 2004.
32. M. Crowder, Classical Competing Risks.: Chapman and Hall/CRC, 2004.
33. W. Kuo, "Challenges related to reliability in nano electronics," IEEE Trans. Reliability, vol. 55, pp. 569-570, 2006.
34. F. Pascual, "Accelerated life test planning with independent Weibull competing risks with known shape parameter," IEEE Trans. Reliability, vol. 56, pp. 85-93, 2007.