High-resolution hard-x-ray microscopy using second-order zone-plate diffraction

Journal of Physics D: Applied Physics

Volumn 44, Issue 23, 2011, Pages

  Yi, Jaemock ^a   Chu, Yong S ^b   Chen, Yu Tung ^c   Chen, Tsung Yu ^c   Hwu, Y ^c,d,e   Margaritondo, G ^f  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c INSTITUTE OF PHYSICS   (Taiwan)

^d NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^e NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^f EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH ASPECT RATIO; HIGH RESOLUTION; NM RESOLUTION; SECOND ORDERS; SPATIAL RESOLUTION; X RAY MICROSCOPY; ZONE PLATES;

ASPECT RATIO; X RAY MICROSCOPES; X RAYS;

DIFFRACTION;

EID: 79957722550     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/23/232001     Document Type: Article

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