An investigation of the electrical properties of p-type Al:N Co-doped ZnO thin films

Journal of the Korean Physical Society

Volumn 61, Issue 10, 2012, Pages 1737-1741

  Saravanakumar, Balasubramaniam ^a   Mohan, Rajneesh ^a   Kim, Sang Jae ^a  

^a Jeju National University   (South Korea)

Author keywords

Carrier concentration; Co doping; Mobility; p type ZnO

Indexed keywords

EID: 84870845696     PISSN: 03744884     EISSN: 19768524     Source Type: Journal    
DOI: 10.3938/jkps.61.1737     Document Type: Article

References (31)

1. F. Qian, Y. S. Gradecak Li, C. Y. Wen and C. M. Liber, Nano Lett. 5, 2287 (2007).
2. S. K. Lee, T. H. Kim, S. Y. Lee, K. C. Choi and P. Yang, Philos. Mag. 87, 2105 (2007).
3. J. Bao, M. A. Zimmler and F. Capasso, Nano Lett. 6, 1719 (2006).
4. M. Jeong, B. Oh, M. Ham and J. M. Myoung, J. Appl. Phys. Lett. 88, 202105 (2006).
5. O. Hayden, R. Agarwal and C. M. Lieber, Nature 5, 352 (2006).
6. A. Tsukazaki et al., Nat. Mater. 4, 42 (2005).
7. J. H. Lim, C. K. Kang, K. K. Kim, I. K. Park, D. K. Hwang and S. J. Park, Adv. Mater. 18, 2720 (2006).
8. J. Bian, W. Liu, J. Sun and H. Liang, J. Mater. Process. Technol. 184, 451 (2007).
9. Y. Ryu, T. S. Lee, J. A. Lubguban, H. W. White, J. J. Kim, Y. S. Park and C. J. Youn, Appl. Phys. Lett. 88, 241108 (2006).
10. D. C. Look, J. W. Hemsky and J. R. Sizelove, Phys. Rev. Lett. 82, 2552 (1999).
11. O. Maksimov, Rev. Adv. Mater. Sci. 24, 26 (2010).
12. H. C. Lu, J. L. Lu, C. Y. Lai and G. M. Wu, Phys. B 404, 4846 (2009).
13. H. P. Tang, Z. Z. Ye and H. P. He, Opt. Mater. 30, 1422 (2008).
14. B. Q. Cao, M. Lorenz, M. Brandt, H. von Wenckstern, J. Lenzner, G. Biehne and M. Grundmann, Phys. Status Solidi RRL 2, 37 (2008).
15. D.-K. Hwang, M.-S. Oh, J.-H. Lim, C.-G. Kang and S.-J. Park, Appl. Phys. Lett. 90, 021106 (2007).
16. G. Wang, S. Chu, N. Zhan, Y. Lin, L. Chernyak and J. Liu, Appl. Phys. Lett. 98, 041107 (2011).
17. C. H. Park, S. B. Zhang and S. H. Wei, Phys. Rev. B 66, 073202 (2002).
18. E. Burstein, Phys. Rev. 93, 632 (1954).
19. H. Zhou, D. Yi, Z. Yu, L. Xiao and J. Li, Thin Solid Films 515, 6909 (2007).
20. Z. Q. Xu, H. Deng, Y. Li, Q. H. Guo and Y. R. Li, Mater. Res. Bull. 41, 354 (2006).
21. F. Yakuphanoglu, M. Sekerci and O. F. Ozturk, Opt. Commun. 239, 275 (2004).
22. S. Dhara and P. K. Giri, Thin Solid Films 520, 5000 (2012).
23. P. Barquinha, G. Gonçalves, L. Pereira, R. Martins and E. Fortunato, Thin Solid Films 515, 8450 (2007).
24. Y. Zhang, W. Fa, F. Yang, Z. Zheng and P. Zhang, Ionics 16, 815 (2010).
25. D. H. Zhange and E. D. Brodie, Thin Solid Films 238, 95 (1994).
26. D. Bao, H. Gu and A. Kuang, Thin Solid Films 312, 37 (1998).
27. M. Martienssen and H. Warlimont, Springer Handbook of Condensed Matter and Materials Data (Springer, 2005).
28. R. Martel, T. Schmidt, H. R. Shea, T. Hertel and Ph. Avouris, Appl. Phys. Lett. 73, 2447 (1998).
29. N. Ito, Y. Sato, P. K. Song, A. Kaijio, K. Inoue and Y. Shigesato, Thin Solid Films 496, 99 (2006).
30. J. Leenheer, J. D. Perkins, M. A. van Hest, J. J. Berry, R. P. O'Hayre and D. S. Ginley, Phys. Rev. B 77, 115215 (2008).
31. B. Y. Oh, M. C. Jeong, D. S. Kim, W. Lee and J. M. Myoung, J. Cryst. Growth 281, 475 (2005).