Characteristics of Al-doped c-axis orientation ZnO thin films prepared by the sol-gel method

Materials Research Bulletin

Volumn 41, Issue 2, 2006, Pages 354-358

  Xu, Z Q ^a   Deng, H ^a   Li, Y ^a   Guo, Q H ^a   Li, Y R ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

B. Electrical properties; B. Sol gel; D. Optical properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT TRANSMISSION; SOL-GELS; ULTRAVIOLET SPECTROMETERS; X RAY DIFFRACTION; ZINC OXIDE;

ELECTRICAL PROPERTIES; SOL-GEL METHOD; WURTZITE; ZNO THIN FILMS;

THIN FILMS;

EID: 30344462679     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2005.08.014     Document Type: Article

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