SCOPUS 정보 검색 플랫폼

Volumn 112, Issue 10, 2012, Pages

Unipolar resistive switching characteristics of pnictogen oxide films: Case study of Sb2O5

(9) Ahn, Youngbae a Wook Ryu, Seung b Ho Lee, Jong a Park, Ji Woon a Hwan Kim, Gun a Seok Kim, Young a Heo, Jaeyeong c Seong Hwang, Cheol a Joon Kim, Hyeong a

a Seoul National University (South Korea)

b Stanford University (United States)

c Chonnam National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING FILAMENT; DENSITY VARIATIONS; ELECTRICAL ENDURANCE; ORDERS OF MAGNITUDE; OXIDE MATERIALS; OXYGEN LOSS; PROFILING MEASUREMENTS; RESISTIVE SWITCHING; TRANSITION-METAL OXIDES;

AMORPHOUS FILMS; AUGER ELECTRON SPECTROSCOPY; ELECTRIC CIRCUIT BREAKERS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METALLIC COMPOUNDS; OXIDE FILMS; OXYGEN; PHOTOELECTRONS; PLATINUM; SWITCHING SYSTEMS; TRANSITION METALS; X RAY PHOTOELECTRON SPECTROSCOPY;

CONDUCTIVE FILMS;

EID: 84870700262 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4766415 Document Type: Article

Times cited : (11)

References (41)

1
- 84863158824
- 10.1557/mrs.2011.356
- J. J. Yang, I. H. Inoue, T. Mikolajick, and C. S. Hwang, MRS Bull. 37 (02), 131 (2012); 10.1557/mrs.2011.356
- (2012) MRS Bull. , vol.37 , Issue.2 , pp. 131
- Yang, J.J.¹ Inoue, I.H.² Mikolajick, T.³ Hwang, C.S.⁴

2
- 84863507287
- 10.1088/0034-4885/75/7/076502
- D. S. Jeong, R. Thomas, R. S. Katiyar, J. F. Scott, H. Kohlstedt, A. Petraru, and C. S. Hwang, Rep. Prog. Phys. 75 (7), 076502 (2012). 10.1088/0034-4885/75/7/076502
- (2012) Rep. Prog. Phys. , vol.75 , Issue.7 , pp. 076502
- Jeong, D.S.¹ Thomas, R.² Katiyar, R.S.³ Scott, J.F.⁴ Kohlstedt, H.⁵ Petraru, A.⁶ Hwang, C.S.⁷

3
- 0036923301
- 10.1109/IEDM.2002.1175811
- W. W. Zhuang, W. Pan, B. D. Ulrich, J. J. Lee, L. Stecker, A. Burmaster, D. R. Evans, S. T. Hsu, M. Tajiri, A. Shimaoka, K. Inoue, T. Naka, N. Awaya, A. Sakiyama, Y. Wang, S. Q. Liu, N. J. Wu, and A. Ignatiev, IEEE Electron Devices Meet. 2002, 193. 10.1109/IEDM.2002.1175811
- IEEE Electron Devices Meet. , vol.2002 , pp. 193
- Zhuang, W.W.¹ Pan, W.² Ulrich, B.D.³ Lee, J.J.⁴ Stecker, L.⁵ Burmaster, A.⁶ Evans, D.R.⁷ Hsu, S.T.⁸ Tajiri, M.⁹ Shimaoka, A.¹⁰ Inoue, K.¹¹ Naka, T.¹² Awaya, N.¹³ Sakiyama, A.¹⁴ Wang, Y.¹⁵ Liu, S.Q.¹⁶ Wu, N.J.¹⁷ Ignatiev, A.¹⁸

4
- 67650102619
- 10.1002/adma.200900375
- R. Waser, R. Dittmann, G. Staikov, and K. Szot, Adv. Mater. 21 (25-26), 2632 (2009). 10.1002/adma.200900375
- (2009) Adv. Mater. , vol.21 , Issue.2526 , pp. 2632
- Waser, R.¹ Dittmann, R.² Staikov, G.³ Szot, K.⁴

5
- 34250327548
- 10.1149/1.2742989
- D. S. Jeong, H. Schroeder, and R. Waser, Electrochem. Solid-State Lett. 10, G51 (2007). 10.1149/1.2742989
- (2007) Electrochem. Solid-State Lett. , vol.10 , pp. 51
- Jeong, D.S.¹ Schroeder, H.² Waser, R.³

6
- 85135532425
- 10.1088/0957-4484/21/30/305203
- K. M. Kim, G. H. Kim, S. J. Song, J. Y. Seok, M. H. Lee, J. H. Yoon, and C. S. Hwang, Nanotechnology 21, 305203 (2010); 10.1088/0957-4484/21/30/305203
- (2010) Nanotechnology , vol.21 , pp. 305203
- Kim, K.M.¹ Kim, G.H.² Song, S.J.³ Seok, J.Y.⁴ Lee, M.H.⁵ Yoon, J.H.⁶ Hwang, C.S.⁷

7
- 79956084549
- 10.1088/0957-4484/22/25/254010
- K. M. Kim, B. J. Choi, M. H. Lee, G. H. Kim, S. J. Song, J. Y. Seok, J. H. Yoon, S. Han, and C. S. Hwang, Nanotechnology 22, 254010 (2011); 10.1088/0957-4484/22/25/254010
- (2011) Nanotechnology , vol.22 , pp. 254010
- Kim, K.M.¹ Choi, B.J.² Lee, M.H.³ Kim, G.H.⁴ Song, S.J.⁵ Seok, J.Y.⁶ Yoon, J.H.⁷ Han, S.⁸ Hwang, C.S.⁹

8
- 84862910019
- 10.1088/0957-4484/23/3/035201
- K. M. Kim, S. Han, and C. S. Hwang, Nanotechnology 23, 035201 (2012). 10.1088/0957-4484/23/3/035201
- (2012) Nanotechnology , vol.23 , pp. 035201
- Kim, K.M.¹ Han, S.² Hwang, C.S.³

9
- 84860200756
- 10.1088/0957-4484/23/18/185202
- K. J. Yoon, M. H. Lee, G. H. Kim, S. J. Song, J. Y. Seok, S. Han, J. H. Yoon, K. M. Kim, and C. S. Hwang, Nanotechnology 23 (18), 185202 (2012). 10.1088/0957-4484/23/18/185202
- (2012) Nanotechnology , vol.23 , Issue.18 , pp. 185202
- Yoon, K.J.¹ Lee, M.H.² Kim, G.H.³ Song, S.J.⁴ Seok, J.Y.⁵ Han, S.⁶ Yoon, J.H.⁷ Kim, K.M.⁸ Hwang, C.S.⁹

10
- 79960642086
- 10.1038/nmat3070
- M. J. Lee, C. B. Lee, D. Lee, S. R. Lee, M. Chang, J. H. Hur, Y. B. Kim, C. J. Kim, D. H. Seo, and S. Seo, Nature Mater. 10 (8), 625 (2011). 10.1038/nmat3070
- (2011) Nature Mater. , vol.10 , Issue.8 , pp. 625
- Lee, M.J.¹ Lee, C.B.² Lee, D.³ Lee, S.R.⁴ Chang, M.⁵ Hur, J.H.⁶ Kim, Y.B.⁷ Kim, C.J.⁸ Seo, D.H.⁹ Seo, S.¹⁰

11
- 76649133422
- 10.1038/nnano.2009.456
- D. H. Kwon, K. M. Kim, J. H. Jang, J. M. Jeon, M. H. Lee, G. H. Kim, X. S. Li, G. S. Park, B. Lee, and S. Han, Nat. Nanotechnol. 5 (2), 148 (2010). 10.1038/nnano.2009.456
- (2010) Nat. Nanotechnol. , vol.5 , Issue.2 , pp. 148
- Kwon, D.H.¹ Kim, K.M.² Jang, J.H.³ Jeon, J.M.⁴ Lee, M.H.⁵ Kim, G.H.⁶ Li, X.S.⁷ Park, G.S.⁸ Lee, B.⁹ Han, S.¹⁰

12
- 65249161894
- 10.1021/nl803387q
- M. J. Lee, S. Han, S. H. Jeon, B. H. Park, B. S. Kang, S. E. Ahn, K. H. Kim, C. B. Lee, C. J. Kim, and I. K. Yoo, Nano Lett. 9 (4), 1476 (2009). 10.1021/nl803387q
- (2009) Nano Lett. , vol.9 , Issue.4 , pp. 1476
- Lee, M.J.¹ Han, S.² Jeon, S.H.³ Park, B.H.⁴ Kang, B.S.⁵ Ahn, S.E.⁶ Kim, K.H.⁷ Lee, C.B.⁸ Kim, C.J.⁹ Yoo, I.K.¹⁰

13
- 79956064739
- 10.1088/0957-4484/22/25/254002
- K. M. Kim, D. S. Jeong, and C. S. Hwang, Nanotechnology 22, 254002 (2011). 10.1088/0957-4484/22/25/254002
- (2011) Nanotechnology , vol.22 , pp. 254002
- Kim, K.M.¹ Jeong, D.S.² Hwang, C.S.³

14
- 77955732575
- 10.1002/adma.201000186
- J. P. Strachan, M. D. Pickett, J. J. Yang, S. Aloni, A. L. David Kilcoyne, G. Medeiros-Ribeiro, and R. Stanley Williams, Adv. Mater. 22 (32), 3573 (2010). 10.1002/adma.201000186
- (2010) Adv. Mater. , vol.22 , Issue.32 , pp. 3573
- Strachan, J.P.¹ Pickett, M.D.² Yang, J.J.³ Aloni, S.⁴ David Kilcoyne, A.L.⁵ Medeiros-Ribeiro, G.⁶ Stanley Williams, R.⁷

15
- 0003706351
- (Am. Ceram. Soc. Columbus, Ohio).
- E. M. Levin, C. R. Robbins, and H. F. McMurdie, Phase Diagram for Ceramists (Am. Ceram. Soc. Columbus, Ohio, 1969).
- (1969) Phase Diagram for Ceramists
- Levin, E.M.¹ Robbins, C.R.² McMurdie, H.F.³

16
- 84870663158
- 10.1007/s11669-007-9189-4
- H. Okamoto, J. Phase Equilib. Diffus. 29 (1), 124 (2008). 10.1007/s11669-007-9189-4
- (2008) J. Phase Equilib. Diffus. , vol.29 , Issue.1 , pp. 124
- Okamoto, H.¹

17
- 0030086999
- 10.1007/BF02648373
- S. P. Garg, N. Krishnamurthy, A. Awasthi, and M. Venkatraman, J. Phase Equilib. 17 (1), 63 (1996). 10.1007/BF02648373
- (1996) J. Phase Equilib. , vol.17 , Issue.1 , pp. 63
- Garg, S.P.¹ Krishnamurthy, N.² Awasthi, A.³ Venkatraman, M.⁴

18
- 33750428912
- 10.1149/1.2353899
- K. M. Kim, B. J. Choi, B. W. Koo, S. Choi, D. S. Jeong, and C. S. Hwang, Electrochem. Solid-State Lett. 9, G343 (2006). 10.1149/1.2353899
- (2006) Electrochem. Solid-State Lett. , vol.9 , pp. 343
- Kim, K.M.¹ Choi, B.J.² Koo, B.W.³ Choi, S.⁴ Jeong, D.S.⁵ Hwang, C.S.⁶

19
- 84859747018
- 10.1038/srep00242
- J. Yao, L. Zhong, D. Natelson, and J. M. Tour, Sci. Rep. 2, (2012). 10.1038/srep00242
- (2012) Sci. Rep. , vol.2
- Yao, J.¹ Zhong, L.² Natelson, D.³ Tour, J.M.⁴

20
- 79951833149
- 10.1109/IEDM.2010.5703395
- H. Y. Lee, Y. S. Chen, P. S. Chen, P. Y. Gu, Y. Y. Hsu, S. M. Wang, W. H. Liu, C. H. Tsai, S. S. Sheu, and P. C. Chiang, IEEE Electron Devices Meet. 2010, 19.7.1; 10.1109/IEDM.2010.5703395
- (2010) IEEE Electron Devices Meet. , pp. 1971
- Lee, H.Y.¹ Chen, Y.S.² Chen, P.S.³ Gu, P.Y.⁴ Hsu, Y.Y.⁵ Wang, S.M.⁶ Liu, W.H.⁷ Tsai, C.H.⁸ Sheu, S.S.⁹ Chiang, P.C.¹⁰

21
- 77952328469
- 10.1109/IEDM.2009.5424411
- Y. S. Chen, H. Y. Lee, P. S. Chen, P. Y. Gu, C. W. Chen, W. P. Lin, W. H. Liu, Y. Y. Hsu, S. S. Sheu, and P. C. Chiang, IEEE Electron Devices Meet. 2009, 1; 10.1109/IEDM.2009.5424411
- (2009) IEEE Electron Devices Meet. , pp. 1
- Chen, Y.S.¹ Lee, H.Y.² Chen, P.S.³ Gu, P.Y.⁴ Chen, C.W.⁵ Lin, W.P.⁶ Liu, W.H.⁷ Hsu, Y.Y.⁸ Sheu, S.S.⁹ Chiang, P.C.¹⁰

22
- 77951587543
- 10.1063/1.3357283
- P. Gonon, M. Mougenot, C. Vallée, C. Jorel, V. Jousseaume, H. Grampeix, and F. El Kamel, J. Appl. Phys. 107 (7), 074507 (2010). 10.1063/1.3357283
- (2010) J. Appl. Phys. , vol.107 , Issue.7 , pp. 074507
- Gonon, P.¹ Mougenot, M.² Vallée, C.³ Jorel, C.⁴ Jousseaume, V.⁵ Grampeix, H.⁶ El Kamel, F.⁷

23
- 0038566844
- Version 3.4 (Web Version) U. S. Department of Commerce.
- C. D. Wagner, A. V. Naumkin, A. Kraut-Vass, J. W. Allison, C. J. Powell, J. R. Rumble, Jr., A. Y. Lee, and D. M. Blakeslee, NIST X-ray Photoelectron Spectroscopy Database, NIST Standard Reference Database 20., Version 3.4 (Web Version) U. S. Department of Commerce, 2003.
- (2003) NIST X-ray Photoelectron Spectroscopy Database, NIST Standard Reference Database 20
- Wagner, C.D.¹ Naumkin, A.V.² Kraut-Vass, A.³ Allison, J.W.⁴ Powell, C.J.⁵ Rumble Jr., J.R.⁶ Lee, A.Y.⁷ Blakeslee, D.M.⁸

24
- 43349101629
- 10.1002/adma.200702024
- S. C. Chae, J. S. Lee, S. Kim, S. B. Lee, S. H. Chang, C. Liu, B. Kahng, H. Shin, D. W. Kim, and C. U. Jung, Adv. Mater. 20 (6), 1154 (2008). 10.1002/adma.200702024
- (2008) Adv. Mater. , vol.20 , Issue.6 , pp. 1154
- Chae, S.C.¹ Lee, J.S.² Kim, S.³ Lee, S.B.⁴ Chang, S.H.⁵ Liu, C.⁶ Kahng, B.⁷ Shin, H.⁸ Kim, D.W.⁹ Jung, C.U.¹⁰

25
- 78650362199
- 10.1063/1.3525710
- K. Jung, Y. Kim, W. Jung, H. Im, B. Park, J. Hong, J. Lee, J. Park, and J. K. Lee, Appl. Phys. Lett. 97 (23), 233509 (2010). 10.1063/1.3525710
- (2010) Appl. Phys. Lett. , vol.97 , Issue.23 , pp. 233509
- Jung, K.¹ Kim, Y.² Jung, W.³ Im, H.⁴ Park, B.⁵ Hong, J.⁶ Lee, J.⁷ Park, J.⁸ Lee, J.K.⁹

26
- 34247877733
- 10.1063/1.2734900
- X. Wu, P. Zhou, J. Li, L. Y. Chen, H. B. Lv, Y. Y. Lin, and T. A. Tang, Appl. Phys. Lett. 90 (18), 183507 (2007). 10.1063/1.2734900
- (2007) Appl. Phys. Lett. , vol.90 , Issue.18 , pp. 183507
- Wu, X.¹ Zhou, P.² Li, J.³ Chen, L.Y.⁴ Lv, H.B.⁵ Lin, Y.Y.⁶ Tang, T.A.⁷

27
- 33646885556
- 10.1063/1.2204649
- D. C. Kim, S. Seo, S. E. Ahn, D. S. Suh, M. J. Lee, B. H. Park, I. K. Yoo, I. G. Baek, H. J. Kim, and E. K. Yim, Appl. Phys. Lett. 88 (20), 202102 (2006). 10.1063/1.2204649
- (2006) Appl. Phys. Lett. , vol.88 , Issue.20 , pp. 202102
- Kim, D.C.¹ Seo, S.² Ahn, S.E.³ Suh, D.S.⁴ Lee, M.J.⁵ Park, B.H.⁶ Yoo, I.K.⁷ Baek, I.G.⁸ Kim, H.J.⁹ Yim, E.K.¹⁰

28
- 22144448904
- 10.1063/1.1968416
- C. Rohde, B. J. Choi, D. S. Jeong, S. Choi, J. S. Zhao, and C. S. Hwang, Appl. Phys. Lett. 86, 262907 (2005). 10.1063/1.1968416
- (2005) Appl. Phys. Lett. , vol.86 , pp. 262907
- Rohde, C.¹ Choi, B.J.² Jeong, D.S.³ Choi, S.⁴ Zhao, J.S.⁵ Hwang, C.S.⁶

29
- 58149268896
- 10.1063/1.3032896
- Y. H. Do, J. S. Kwak, J. P. Hong, K. Jung, and H. Im, J. Appl. Phys. 104 (11), 114512 (2008). 10.1063/1.3032896
- (2008) J. Appl. Phys. , vol.104 , Issue.11 , pp. 114512
- Do, Y.H.¹ Kwak, J.S.² Hong, J.P.³ Jung, K.⁴ Im, H.⁵

30
- 0346964184
- N. Tigau, V. Ciupina, G. Prodan, G. I. Rusu, C. Gheorghies, and E. Vasile, J. Optoelectron. Adv. Mater. 5 (4), 907 (2003).
- (2003) J. Optoelectron. Adv. Mater. , vol.5 , Issue.4 , pp. 907
- Tigau, N.¹ Ciupina, V.² Prodan, G.³ Rusu, G.I.⁴ Gheorghies, C.⁵ Vasile, E.⁶

31
- 0020749558
- 10.1111/j.1151-2916.1983.tb10047.x
- M. Miyayama, S. Ogi, and H. Yanagida, J. Am. Ceram. Soc. 66 (5), 351 (1983); 10.1111/j.1151-2916.1983.tb10047.x
- (1983) J. Am. Ceram. Soc. , vol.66 , Issue.5 , pp. 351
- Miyayama, M.¹ Ogi, S.² Yanagida, H.³

32
- 77956393591
- 10.1016/j.jnoncrysol.2010.04.015
- B. Ouni, J. Ouerfelli, A. Amlouk, K. Boubaker, and M. Amlouk, J. Non-Cryst. Solids 356 (25), 1294 (2010). 10.1016/j.jnoncrysol.2010.04.015
- (2010) J. Non-Cryst. Solids , vol.356 , Issue.25 , pp. 1294
- Ouni, B.¹ Ouerfelli, J.² Amlouk, A.³ Boubaker, K.⁴ Amlouk, M.⁵

33
- 84859530403
- 10.1063/1.3696077
- J. H. Lee, G. H. Kim, Y. B. Ahn, J. W. Park, S. W. Ryu, C. S. Hwang, and H. J. Kim, Appl. Phys. Lett. 100 (12), 123505 (2012). 10.1063/1.3696077
- (2012) Appl. Phys. Lett. , vol.100 , Issue.12 , pp. 123505
- Lee, J.H.¹ Kim, G.H.² Ahn, Y.B.³ Park, J.W.⁴ Ryu, S.W.⁵ Hwang, C.S.⁶ Kim, H.J.⁷

34
- 78650366326
- 10.1063/1.3525801
- J. H. Yoon, K. M. Kim, M. H. Lee, S. K. Kim, G. H. Kim, S. J. Song, J. Y. Seok, and C. S. Hwang, Appl. Phys. Lett. 97 (23), 232904 (2010). 10.1063/1.3525801
- (2010) Appl. Phys. Lett. , vol.97 , Issue.23 , pp. 232904
- Yoon, J.H.¹ Kim, K.M.² Lee, M.H.³ Kim, S.K.⁴ Kim, G.H.⁵ Song, S.J.⁶ Seok, J.Y.⁷ Hwang, C.S.⁸

35
- 79960091416
- 10.1063/1.3600784
- G. H. Kim, J. H. Lee, J. Y. Seok, S. J. Song, J. H. Yoon, K. J. Yoon, M. H. Lee, K. M. Kim, H. D. Lee, and S. W. Ryu, Appl. Phys. Lett. 98, 262901 (2011). 10.1063/1.3600784
- (2011) Appl. Phys. Lett. , vol.98 , pp. 262901
- Kim, G.H.¹ Lee, J.H.² Seok, J.Y.³ Song, S.J.⁴ Yoon, J.H.⁵ Yoon, K.J.⁶ Lee, M.H.⁷ Kim, K.M.⁸ Lee, H.D.⁹ Ryu, S.W.¹⁰

36
- 10844282779
- 10.1051/epjap:2004206
- J. Robertson, Eur. Phys. J. Appl. Phys. 28 (3), 265 (2004). 10.1051/epjap:2004206
- (2004) Eur. Phys. J. Appl. Phys. , vol.28 , Issue.3 , pp. 265
- Robertson, J.¹

37
- 0031169549
- 10.1023/A:1018657424566
- P. Puspharajah, S. Radhakrishna, and A. K. Arof, J. Mater. Sci. 32 (11), 3001 (1997). 10.1023/A:1018657424566
- (1997) J. Mater. Sci. , vol.32 , Issue.11 , pp. 3001
- Puspharajah, P.¹ Radhakrishna, S.² Arof, A.K.³

38
- 0025415341
- 10.1016/0040-6090(90)90500-D
- W. A. Badawy, Thin Solid Films 186 (1), 59 (1990). 10.1016/0040-6090(90) 90500-D
- (1990) Thin Solid Films , vol.186 , Issue.1 , pp. 59
- Badawy, W.A.¹

39
- 0027683754
- 10.1111/j.1151-2916.1993.tb03970.x
- S. H. Kim, T. Yoko, and S. Sakka, J. Am. Ceram. Soc. 76 (10), 2486 (1993). 10.1111/j.1151-2916.1993.tb03970.x
- (1993) J. Am. Ceram. Soc. , vol.76 , Issue.10 , pp. 2486
- Kim, S.H.¹ Yoko, T.² Sakka, S.³

40
- 0021598490
- 10.1016/0022-3093(84)90128-5
- E. F. Lambson, G. A. Saunders, B. Bridge, and R. A. El-Mallawany, J. Non-Cryst. Solids 69 (1), 117 (1984). 10.1016/0022-3093(84)90128-5
- (1984) J. Non-Cryst. Solids , vol.69 , Issue.1 , pp. 117
- Lambson, E.F.¹ Saunders, G.A.² Bridge, B.³ El-Mallawany, R.A.⁴

41
- 0003477976
- (Wiley-VCH, Weinheim, Germany).
- B. Ihsan, Thermochemical Data of Pure Substances (Wiley-VCH, Weinheim, Germany, 1989).
- (1989) Thermochemical Data of Pure Substances
- Ihsan, B.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.