Electronic bipolar resistance switching in an anti-serially connected Pt/TiO 2/Pt structure for improved reliability

Nanotechnology

Volumn 23, Issue 3, 2012, Pages

  Kim, Kyung Min ^a   Han, Seungwu ^a   Hwang, Cheol Seong ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE RELIABILITY; ELECTRONIC SWITCHING; IMPROVED RELIABILITY; INDEPENDENT CONTROL; RESISTANCE RATIO; RESISTANCE STATE; RESISTANCE SWITCHING; RESISTIVE SWITCHING; TRAP DISTRIBUTIONS; VACANCY MIGRATION;

DURABILITY; PLATINUM; RELIABILITY;

SWITCHING;

EID: 84862910019     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/3/035201     Document Type: Article

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