The temperature dependence in nanoresistive switching of HfAlO

IEEE Transactions on Nanotechnology

Volumn 11, Issue 6, 2012, Pages 1059-1062

  Zhou, Peng ^a   Ye, Li ^a   Sun, Qing Qing ^a   Chen, Lin ^a   Ding, Shi Jin ^a   Jiang, An Quan ^a   Zhang, David Wei ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

Critical region; low temperature; resistive switching

Indexed keywords

CONDUCTIVE FILAMENTS; CONDUCTIVE PATHS; CRITICAL REGION; ELECTRICAL FIELD; ELECTRON TRANSPORT; LOW TEMPERATURES; RESISTIVE SWITCHING; RESISTIVE SWITCHING MEMORIES; TEMPERATURE DEPENDENCE; TWO-STATE;

OXYGEN VACANCIES; TEMPERATURE DISTRIBUTION;

SWITCHING SYSTEMS;

EID: 84870288855     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2012.2212453     Document Type: Article

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