Correlation between morphology and electro-optical properties of nanostructured CdO thin films: Influence of Al doping

Surface and Coatings Technology

Volumn 213, Issue , 2012, Pages 15-20

  Abdolahzadeh Ziabari, A ^a,b   Ghodsi, F E ^a   Kiriakidis, G ^c  

^a UNIVERSITY OF GUILAN   (Iran)

^b ISLAMIC AZAD UNIVERSITY   (Iran)

^c INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

Author keywords

AFM; CdO:Al; SEM; Sol gel; Thin film

Indexed keywords

AFM; AFM IMAGE; AL CONTENT; AL DOPED; AL-CONCENTRATION; AL-DOPING; CADMIUM OXIDE; CDO THIN FILMS; CDO:AL; CRYSTALLINITIES; DEBYE-SCHERRER FORMULA; EFFECT ANALYSIS; ELECTROOPTICAL PROPERTIES; FILM MICROSTRUCTURES; FRACTAL BEHAVIORS; GLASS SUBSTRATES; NANO-STRUCTURED; OPTICAL TRANSPARENCY; OPTOELECTRONIC PROPERTIES; PRECURSOR SOLUTIONS; ROOT MEAN SQUARE ROUGHNESS; SOL-GEL DIP-COATING METHOD; SPHERICAL GRAINS; UV VISIBLE SPECTROSCOPY; VISIBLE REGION;

ATOMIC FORCE MICROSCOPY; CADMIUM; CADMIUM COMPOUNDS; FRACTALS; MORPHOLOGY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SOL-GELS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ALUMINUM;

EID: 84870245954     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2012.10.003     Document Type: Article

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