Electrical, optical and structural properties of aluminum doped cadmium oxide thin films prepared by spray pyrolysis technique

Materials Chemistry and Physics

Volumn 122, Issue 2-3, 2010, Pages 444-448

  Kumaravel, R ^a   Menaka, S ^a   Snega, S Regina Mary ^a   Ramamurthi, K ^a   Jeganathan, K ^a  

^a BHARATHIDASAN UNIVERSITY   (India)

Author keywords

Atomic force microscopy; CdO; Electrical properties; Spray pyrolysis; Thin films

Indexed keywords

AL FILMS; AL-DOPING; BAND-GAP VALUES; CADMIUM OXIDE; CDO; CDO FILMS; CUBIC CRYSTAL STRUCTURES; DOPING LEVELS; ELECTRICAL , OPTICAL AND STRUCTURAL PROPERTIES; ELECTRICAL PROPERTIES; ELECTRICAL PROPERTY; GLASS SUBSTRATES; HALL MEASUREMENTS; OPTICAL TRANSMITTANCE; PREFERRED ORIENTATIONS; SPRAY PYROLYSIS METHOD; SPRAY-PYROLYSIS TECHNIQUES; XRD ANALYSIS;

ALUMINUM; ALUMINUM COATINGS; ATOMIC FORCE MICROSCOPY; ATOMS; CADMIUM; CADMIUM COMPOUNDS; CARRIER CONCENTRATION; CONDUCTIVE FILMS; CRYSTAL ORIENTATION; DOPING (ADDITIVES); ELECTRIC PROPERTIES; OPTICAL PROPERTIES; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

SPRAY PYROLYSIS;

EID: 77953175712     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2010.03.022     Document Type: Article

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