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Journal of Materials Science: Materials in Electronics

Volumn 22, Issue 5, 2011, Pages 492-498

Optical, structural and surface characterization of CdO:Mg films

(5) Atay, F a Akyuz, I a Kose, S a Ketenci, E a Bilgin, V b

a ESKISEHIR OSMANGAZI UNIVERSITY (Turkey)

b ÇANAKKALE ONSEKIZ MART UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGE; BAND-GAP VALUES; CDO FILMS; GRAIN SIZE; MG FILMS; MG-DOPED; MG-DOPING; OPTICAL METHODS; PHOTOVOLTAIC APPLICATIONS; REFLECTANCE SPECTRUM; STRUCTURAL AND SURFACE CHARACTERIZATION; TEXTURE COEFFICIENT; ULTRASONIC SPRAY PYROLYSIS TECHNIQUE;

CADMIUM COMPOUNDS; DIFFRACTION; LATTICE CONSTANTS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SPRAY PYROLYSIS; SURFACE TOPOGRAPHY; TOPOGRAPHY; ULTRASONIC TESTING; X RAY DIFFRACTION;

SEMICONDUCTOR DOPING;

EID: 79954451485 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-010-0166-z Document Type: Article

Times cited : (39)

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